| Literature DB >> 27933830 |
Kotaro Makino1, Shota Kuromiya2, Keisuke Takano2, Kosaku Kato2, Makoto Nakajima2, Yuta Saito1, Junji Tominaga1, Hitoshi Iida3, Moto Kinoshita3, Takashi Nakano1.
Abstract
We proposed and demonstrated terahertz (THz) pulse detection by means of multilayered GeTe/Sb2Te3 phase-change memory materials that are also known as a multilayer topological insulator-normal insulator (MTN) system. THz time-domain spectroscopy measurement was performed for MTN films with different multilayer repetitions as well as a conventional as-grown Ge-Te-Sb (GST) alloy film. It was found that MTNs absorb THz waves and that the absorption coefficient depends on the number of layers, while the as-grown GST alloy film was almost transparent for THz waves. Simple MTN-based THz detection devices were fabricated, and the THz-induced change in the current signal was measured when a DC bias voltage was applied between the electrodes. We confirmed that irradiation of THz pulse causes a decrease in the resistance of the MTNs. This result indicates that our devices are capable of THz detection.Entities:
Keywords: THz detection; THz spectroscopy; chalcogenide superlattice; multilayer system; phase change material; topological insulator
Year: 2016 PMID: 27933830 DOI: 10.1021/acsami.6b11418
Source DB: PubMed Journal: ACS Appl Mater Interfaces ISSN: 1944-8244 Impact factor: 9.229