| Literature DB >> 27897340 |
Zixiong Sun1, Chunrui Ma2, Ming Liu1, Jin Cui1, Lu Lu1, Jiangbo Lu1, Xiaojie Lou3, Lei Jin4, Hong Wang1, Chun-Lin Jia1,4.
Abstract
Ultrahigh energy storage density of 52.4 J cm-3 with optimistic efficiency of 72.3% is achieved by interface engineering of epitaxial lead-free oxide multilayers at room temperature. Moreover, the excellent thermal stability of the performances provides solid basis for widespread applications of the thin film systems in modern electronic and power modules in harsh working environments.Entities:
Keywords: dielectrics; energy storage density; lead-free ceramic; thermal stability; thin films
Year: 2016 PMID： 27897340 DOI： 10.1002/adma.201604427
Source DB: PubMed Journal: Adv Mater ISSN： 0935-9648 Impact factor: 30.849