| Literature DB >> 27897171 |
D Santamaria-Perez1,2, C McGuire1, A Makhluf1, A Kavner1, R Chuliá-Jordan2, J L Jorda3, F Rey3, J Pellicer-Porres2, D Martinez-García2, P Rodriguez-Hernández4, A Muñoz4.
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Year: 2016 PMID: 27897171 PMCID: PMC5141295 DOI: 10.1038/ncomms13647
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Figure 1Calculated X-ray diffraction profiles of both the cristobalite Si0.4C0.6O2 solid solution and the ReO2 phases.
Patterns were calculated to correspond to a pressure of 7 GPa, and λ=0.3738 Å. The calculated diffraction pattern for α-cristobalite Si0.4C0.6O2 is depicted in blue (lattice dimensions from ref. 5) and the calculated pattern for Pbcn β-ReO2 is represented in black (a=4.7735 Å, b=5.6047 Å and c=4.5755 Å). Calculated Re peaks are shown in red. Vertical dashed lines correspond to the positions of the X-ray diffraction peaks observed at 7 GPa by Santoro et al. (data obtained from a digitized version of Fig. 2 of ref. 5).
Figure 2Rietveld refinement of the X-ray diffraction pattern at ambient conditions.
This X-ray diffraction pattern corresponds to the recovered CO2:SiO2:Re sample after heating to 2,000 K and compressing to 48 GPa (λ=0.3344 Å). Reflections correspond to β-ReO2, Re and SiO2 stishovite. Experimental data are depicted as scattered black squares, and calculated and full difference X-ray diffraction profiles are represented as red and green lines, respectively. Refined lattice parameters are in the text, refined atomic coordinates are Re (4c: 0, 0.113(1), 0.25) and O (8d: 0.237(3), 0.362(2), 0.397(2)).