| Literature DB >> 27878034 |
Kazimierz Darowicki1, Artur Zieliński1, Krzysztof J Kurzydłowski2.
Abstract
Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new combining approach utilizing multifrequency scanning and simultaneous AFM scanning of an investigated surface.Entities:
Keywords: atomic force microscopy; dynamic electrochemical impedance spectroscopy; non-stationarity
Year: 2008 PMID： 27878034 PMCID： PMC5099648 DOI： 10.1088/1468-6996/9/4/045006
Source DB: PubMed Journal: Sci Technol Adv Mater ISSN： 1468-6996 Impact factor: 8.090