| Literature DB >> 27877481 |
Hyeong-Ho Park1, Xin Zhang2, Seon-Yong Hwang1, Sang Hyun Jung1, Semin Kang1, Hyun-Beom Shin1, Ho Kwan Kang1, Hyung-Ho Park3, Ross H Hill2, Chul Ki Ko1.
Abstract
We present a simple size reduction technique for fabricating 400 nm zinc oxide (ZnO) architectures using a silicon master containing only microscale architectures. In this approach, the overall fabrication, from the master to the molds and the final ZnO architectures, features cost-effective UV photolithography, instead of electron beam lithography or deep-UV photolithography. A photosensitive Zn-containing sol-gel precursor was used to imprint architectures by direct UV-assisted nanoimprint lithography (UV-NIL). The resulting Zn-containing architectures were then converted to ZnO architectures with reduced feature sizes by thermal annealing at 400 °C for 1 h. The imprinted and annealed ZnO architectures were also used as new masters for the size reduction technique. ZnO pillars of 400 nm diameter were obtained from a silicon master with pillars of 1000 nm diameter by simply repeating the size reduction technique. The photosensitivity and contrast of the Zn-containing precursor were measured as 6.5 J cm-2 and 16.5, respectively. Interesting complex ZnO patterns, with both microscale pillars and nanoscale holes, were demonstrated by the combination of dose-controlled UV exposure and a two-step UV-NIL.Entities:
Keywords: Complex patterns; Nanoimprint lithography; Size reduction technique; Zinc oxide
Year: 2012 PMID: 27877481 PMCID: PMC5090631 DOI: 10.1088/1468-6996/13/2/025003
Source DB: PubMed Journal: Sci Technol Adv Mater ISSN: 1468-6996 Impact factor: 8.090