| Literature DB >> 27805163 |
Abstract
The Powder Diffraction file has been the primary reference for Powder Diffraction Data for more than half a century. The file is a collection of about 65 000 reduced powder patterns stored as sets of d/I data along with the appropriate crystallographic, physical and experimental information. This paper reviews the development and growth of the PDF and discusses the role of the ICDD in the maintenance and dissemination of the file.Entities:
Keywords: CD-ROM; ICDD; PDF; phase identification; powder data; x-ray diffraction
Year: 1996 PMID: 27805163 PMCID: PMC4894617 DOI: 10.6028/jres.101.027
Source DB: PubMed Journal: J Res Natl Inst Stand Technol ISSN: 1044-677X
Fig. 1Card image for Ce2(SO4)3 from PDF Set 1 as issued in 1941.
Distribution of patterns in the PDF Sets 1–45
| The subfiles have also been updated with the following numbers of nondeleted patterns in each subfile: | |||
| Common Phases | 3197 | Minerals | 4091 |
| Metals and Alloys | 11 954 | NBS (NIST) | 1969 |
| Forensic | 3012 | Zeolites | 696 |
| Education Package | 1061 | Superconductors | 196 |
| Cements | 308 | Explosives | 149 |
| Corrosive | 13 635 | Polymers | 274 |
| Pigment and Dyes | 166 | Pharmaceutical | 17 |
| The following total statistics are from Sets 1–45 (71 067 patterns): | |||
| Inorganic | 43 836 | Organic | 18 201 |
| Dual | 2584 | Minerals | 6446 |
| Stars | 7218 | Calculated | 3647 |
| Indexed | 16 135 | Unknown quality | 23 295 |
| Poor quality | 12 520 | Deleted | 8215 |
Fig. 2Card image for Ce2(SO4)3 from PDF Set 1 as printed in the 1995 format.
Committees and Subcommittees of the JCPDS-ICDD
| Board of Directors |
| Bylaws Committee |
| Crystal Data Management Board |
| Employee Benefits Committee |
| Ethics Committee |
| Grant-in-aid Committee |
| Journal Oversight Committee |
| Long-Range Planning Committee |
| Membership Committee |
| Member Travel Support Committee |
| Publication Review Committee |
| Scholarship Committee |
| Finance Committee |
| Budget Subcommittee |
| Sales and Marketing |
| Technical Committee |
| Ceramics Subcommittee |
| Crystal Data Subcommittee |
| Data Collection and Analysis Subcommittee |
| Diffraction Problems Subcommittee |
| Data Base Subcommittee |
| Education Subcommittee |
| Electron Diffraction Subcommittee |
| Minerals and Ceramics Subcommittee |
| Metals and Alloys Subcommittee |
| New Products Research and Development Subcommittee |
| Organic and Forensic Subcommittee |
| Pattern Calculation Subcommittee |
| PDF Editorial Staff |
| Search and Match Methods Subcommittee |
| Target Systems Subcommittee |
Fig. 3Display of the Ce2(SO4)3 data in the NBS*AIDS83 databse format from the 1989 PDF.
Several of the tasks performed by NBS*AIDS83
| 1. Formula checking including generation of an empirical formula. |
| 2. Form of the chemical name and comparison with the formula for consistency. |
| 3. Comparison of measured, calculated and estimated densities. |
| 4. Validation of space group, aspect or lattice type with allowed symbols and assigned crystal system. |
| 5. Generation of Pearson symbols for structure types. |
| 6. Refinement of |
| 7. Calculation of the Smith-Snyder and the deWolff figures-of-merit. |
| 8. Assignment of the PDF quality mark using the initial assignment by the topical editor and the fit of the |
| 9. Validation of all the editorial flags. |
| 10. Errors and warnings are given when problems are detected. |
Documentation of PDF data
| Primary |
| Experimental conditions |
| Sample description |
| Composition |
| Source |
| Derived |
| Reference for data |
| Secondary |
| Crystallographic data |
| System |
| Unit cell |
| Space group |
| Density (calculated) |
| Internal standard |
| References for crystal information |
| Tertiary |
| Miller indices |
| Density (measured) |
| Figures-of-merit |
| Axial ratios |
| Crystal Data cell |
| Indices of refraction |
| Reference-intensity-ratio |
| References for physical property data |
| Quaternary |
| Synthesis or mineral locality |
| Stability |
| Structure type |
| Chemical analysis |
Products of the JCPDS-ICDD
| The Powder Diffraction File—Inorganic and Organic |
| Card form (discontinued in 1987) |
| Microfiche form |
| Book form |
| Individual set |
| Historical data (re-edited) |
| NBS Associateship Pattern File |
| Mineral File |
| Metals and Alloys File |
| Common Phases File |
| Forensic File |
| Computer-readable |
| Magnetic tapes |
| PDF-1 |
| PDF-2 |
| Disks |
| CD-ROM |
| Search Manuals |
| Book form |
| Chemical Alphabetical |
| Hanawalt Method |
| Fink Method |
| Elemental and Interplanar Spacing Index |
| Software (provided without charge) |
| Johnson/Vand |
| Goehner/Garbauskas |
| Toby POWDER SUITE |
| Educational Materials |
| PDF Workbook |
| Mineral Workbook |
| Educational Package |
| Methods and Practices Manual |
| ACS Audio Short Course |
| Short Courses |
| Crystal Data |
| Book form |
| Identification File on magnetic tape |
| Minerals |
| CD-ROM |
| Software (provided without charge) |
| Karen/Mighell |
| Harlow/Johnson |
| Electron Diffraction Database |
| Magnetic tape |
| CD-ROM |
| Software (provided without charge) |
| Carr/Johnson |
| Journal |
| |
Contents of PDF-1
| PDF # | |
| Compound Name | |
| Compound Formula | |
| Data Quality Mark | |
| Subfile Code |
Contents of PDF-2
| PDF # | |
| Compound Name | |
| Compound Formula | |
| Data Collection Documentation | |
| Cell and Symmetry | |
| Physical Properties | |
| Preparation and Purity | |
| Sources of Materials | |
| Figures-of-Merit | |
| Data Quality Mark | |
| Subfile Code |
Fig. 4Display of the data image for Ce2(SO4)3 as printed from PCPDFWIN. Position data may be displayed in d, θ, 2-θ, Q or sin2-θ as desired.
Contents of PDF-3
| PDF | Digitized trace |
| Compound Name | |
| Compound Formula | |
| Data Collection Documentation | |
| Digitized Trace Parameters | |
| Reference Sample Trace | |
| Cell and Symmetry | |
| Physical Properties | |
| Preparation and Purity | |
| Sources of Materials | |
| Figures-of-Merit | |
| Data Quality Mark | |
| Subfile Code |
Digitized trace parameters
| Start Angle | Finish Angle | Step Size |
| I 2- | ||
| Reference Intensity Ratio | ||
| Instrument Parameters | ||
| Standard Reference Trace |