| Literature DB >> 27795974 |
Daniel Schick1, Sebastian Eckert2, Niko Pontius1, Rolf Mitzner1, Alexander Föhlisch, Karsten Holldack1, Florian Sorgenfrei2.
Abstract
We present an X-ray-optical cross-correlator for the soft ([Formula: see text]) up to the hard X-ray regime based on a molybdenum-silicon superlattice. The cross-correlation is done by probing intensity and position changes of superlattice Bragg peaks caused by photoexcitation of coherent phonons. This approach is applicable for a wide range of X-ray photon energies as well as for a broad range of excitation wavelengths and requires no external fields or changes of temperature. Moreover, the cross-correlator can be employed on a 10 ps or 100 fs time scale featuring up to 50% total X-ray reflectivity and transient signal changes of more than 20%.Entities:
Year: 2016 PMID: 27795974 PMCID: PMC5065566 DOI: 10.1063/1.4964296
Source DB: PubMed Journal: Struct Dyn ISSN: 2329-7778 Impact factor: 2.920
FIG. 1.Static -scan along q of the Mo/Si SL at (thin blue line) in a specular reflection geometry carried out at the PM3 beamline at BESSY II. The dynamical X-ray diffraction simulation of the SL structure (thick red line) matches the SL's peak positions and the reflectivity for the first and second order SL peaks (SL1 and SL2). The inset sketches the SL structure after photoexcitation with an exponentially decaying periodic temperature profile, as well as the symmetric diffraction geometry.
FIG. 2.(a) Simulated transient strain of only the Mo and Si layers in the SL structure after photoexcitation. (b)-(e) SL oscillation measured at SL Bragg peak maxima at different X-ray photon energies, see legends, with 120 fs temporal resolution in femtoslicing mode. Symbols are measured data and solid lines are fits. The errorbars are at a 66% confidence interval.
FIG. 3.(a) Transient optical SL reflectivity. The gray dashed line is subtracted as background in (b), which shows only the extracted SL oscillation. The solid line represents a damped cosine fit.
FIG. 4.(a) Unpumped -scan at 713 eV around SL3 and probed 70 ps after excitation with a laser fluence of with temporal resolution in single-bunch mode. The shift of the SL Bragg peak corresponds to a strain of 0.09% averaged over the whole probe SL volume. (b) Delay scan (symbols, left y-axis) at the left slope at of the SL3 peak at 713 eV [marked as vertical line in (a)] in single-bunch mode. The errorbars are at a 66% confidence interval. The thin blue line (right y-axis) represents the simulated averaged strain in the Mo/Si SL. The thick red line (left y-axis) is the calculated X-ray reflectivity at based on the simulated strain and convoluted with the temporal resolution of (gray Gaussian at the bottom) of the single bunch at BESSY II.