| Literature DB >> 27787250 |
Malte Ogurreck1, Jefferson J do Rosario2, Elisabeth W Leib3, Daniel Laipple1, Imke Greving1, Felix Marschall4, Arndt Last4, Gerold A Schneider2, Tobias Vossmeyer3, Horst Weller4, Felix Beckmann1, Martin Müller1.
Abstract
Photonic glass is a material class that can be used as photonic broadband reflectors, for example in the infrared regime as thermal barrier coating films. Photonic properties such as the reflectivity depend on the ordering and material packing fraction over the complete film thickness of up to 100 µm. Nanotomography allows acquiring these key parameters throughout the sample volume at the required resolution in a non-destructive way. By performing a nanotomography measurement at the PETRA III beamline P05 on a photonic glass film, the packing fraction throughout the complete sample thickness was analyzed. The results showed a packing fraction significantly smaller than the expected random close packing giving important information for improving the fabrication and processing methods of photonic glass material in the future.Entities:
Keywords: X-ray microscopy; nanotomography; photonic glass
Year: 2016 PMID: 27787250 PMCID: PMC5082463 DOI: 10.1107/S1600577516012960
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616
Figure 1SEM image of the ZrO2 sample after preparation with the FIB and mounted on the sample holder.
Figure 2SEM (top) and XRM (bottom) images of the Siemens star test pattern. The line widths are 50–100 nm in the innermost circle and 100–200 nm in the second circle.
Figure 3Schematic drawing of the optical layout used. The X-ray illumination of the sample is achieved by the rolled X-ray prism lens (1). The sample (2) is mounted in the focal plane of the CRL (4), which is protected from stray X-rays by the aperture (3). The scintillator (5) converts the X-rays to visible light and a tilted mirror (6) protects the microscope optics (7) from radiation damage. The sensor (8) captures the image (Marschall, 2014 ▸).
Figure 4Normalized projection image. The higher absorption on the very top and in the bottom left corner originates from the sample preparation with the focused ion beam.
Figure 5Reconstructed slice of the zirconia photonic glass sample (top). A magnified view of the blue dotted square is shown at the bottom. There are still phase artifacts visible in the reconstruction, for example edge enhancements but the overall sample structure is clearly visible.
Figure 6Visualization of the segmented photonic glass sample. The zirconia particles are marked in yellow whereas the empty matrix is shown in dark blue. A transparent overlay of the sample outline shows the positions of the analyzed areas with respect to the sample.
Figure 7Plot of the packing fraction η for the photonic glass sample. Individual slices are marked with orange dots and error bars, local ensemble averages are given by the blue bars. The packing fraction is very constant throughout the sample height with an increase only towards the bottom.
Figure 8SEM image of the FIB slicing surface used for determination of the packing fraction. FIB curtaining effects can be seen in the right part of the sample and are caused by the large sample size and ion beam defocusing.