| Literature DB >> 27722626 |
S-Y Kim1, K Kim1, Y H Hwang2, J Park1, J Jang1, Y Nam3, Y Kang4, M Kim1, H J Park1, Z Lee1, J Choi4, Y Kim5, S Jeong6, B-S Bae3, J-U Park1.
Abstract
As demands for high pixel densities and wearable forms of displays increase, high-resolution printing technologies to achieve high performance transistors beyond current amorphous silicon levels and to allow low-temperature solution processability for plastic substrates have been explored as key processes in emerging flexible electronics. This study describes electrohydrodynamic inkjet (e-jet) technology for direct printing of oxide semiconductor thin film transistors (TFTs) with high resolution (minimum line width: 2 μm) and superb performance, including high mobility (∼230 cm2 V-1 s-1). Logic operations of the amplifier circuits composed of these e-jet-printed metal oxide semiconductor (MOS) TFTs demonstrate their high performance. Printed In2O TFTs with e-jet printing-assisted high-resolution S/D electrodes were prepared, and the direct printing of passivation layers on these channels enhanced their gate-bias stabilities significantly. Moreover, low process temperatures (<250 °C) enable the use of thin plastic substrates; highly flexible and stretchable TFT arrays have been demonstrated, suggesting promise for next-generation printed electronics.Entities:
Year: 2016 PMID: 27722626 DOI: 10.1039/c6nr05577j
Source DB: PubMed Journal: Nanoscale ISSN: 2040-3364 Impact factor: 7.790