| Literature DB >> 27699716 |
Ondřej Cibulka1, Christoph Vorkötter2, Adam Purkrt3, Jakub Holovský3,4, Jan Benedikt2, Kateřina Herynková3.
Abstract
This work compares structural and optical properties of silicon nanocrystals prepared by two fundamentally different methods, namely, electrochemical etching of Si wafers and low-pressure plasma synthesis, completed with a mechano-photo-chemical treatment. This treatment leads to surface passivation of the nanoparticles by methyl groups. Plasma synthesis unlike electrochemical etching allows selecting of the particle sizes. Measured sizes of the nanoparticles by dynamic light scattering show 3 and 20 nm for electrochemically etched and plasma-synthetized samples, respectively. Plasma-synthetized 20-nm particles do not exhibit photoluminescence due to absence of quantum confinement effect, and freshly appeared photoluminescence after surface passivation could indicate presence of organic molecules on the nanoparticle surface, luminescing instead of nanocrystal core. Electrochemically etched sample exhibits dramatic changes in photoluminescence during the mechano-photo-chemical treatment while no photoluminescence is observed for the plasma-synthetized one. We also used the Fourier transform infrared spectroscopy for comparison of the chemical changes happened during the treatment.Entities:
Keywords: Electrochemical etching; Low-pressure plasma; Photoluminescence; Silicon nanocrystals; Size distribution; Surface passivation
Year: 2016 PMID: 27699716 PMCID: PMC5047868 DOI: 10.1186/s11671-016-1655-7
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Fig. 1Electrochemical etching. Etching chamber (a) is composed of a base with a silicon wafer, teflon insert with a platinum electrode at the top and a special anti-corrosive seal at the bottom and a fastening ring. Workplace (b) composes from two etching chambers electrically connected in a series. Solution of each chamber is permanently stirred by a teflon stirrer. Porous silicon layer on top of the etched wafers (c) and scratched powder of SiNCs (d) exhibit bright PL in yellow/orange region
Fig. 2Low-pressure gas-phase plasma reactor. The plasma reactor (a) is composed of a quartz tube, two RF electrodes, gas inlet, and a sample holder. Plasma is generated between two RF electrodes (b) and SiNCs are collected in a glass sample holder (c). Final stage of production of the plasma-synthetized SiNCs (d)
Fig. 4Time evolution of photoluminescence. Panel a shows initial state of PL. Electrochemically etched (black curve) and control samples (blue curve) exhibit weak PL at 550 nm while plasma-synthetized sample with 20-nm particles (red curve) exhibit no PL. Inset of panel a shows PL of 5 nm plasma-synthetized particles which are not study in this paper. Panel b shows PL after 2 weeks of treatment. PL of the control sample slightly increases; new peak at 580 nm appears in PL of the electrochemically etched SiNCs while plasma-synthetized ones exhibit no PL all the time. Panel c shows PL after 5 weeks of treatment. PL of the control sample remains constant; the peak at 580 nm strongly increases in the case of electrochemically etched SiNCs but plasma-synthetized ones exhibit constantly no PL
Fig. 3Size measurements. DLS measurements of electrochemically etched sample show SiNCs 3 nm in diameter while similar investigation of plasma-synthetized particles shows several different sizes—5 nm (blue curve), 20 nm (red curve), and 70 nm (green curve). SiNCs of 20 nm in size were used in this study
Fig. 5FTIR measurements. Infrared spectra of nanocrystals after complete drying of the solvent, taken in the attenuated total reflectance mode. a Control sample. b Etched sample. c Plasma sample