| Literature DB >> 27661260 |
Kyung Min Kim1, Jiaming Zhang1, Catherine Graves1, J Joshua Yang2, Byung Joon Choi3, Cheol Seong Hwang4, Zhiyong Li1, R Stanley Williams1.
Abstract
A Pt/NbOx/TiOy/NbOx/TiN stack integrated on a 30 nm contact via shows a programming current as low as 10 nA and 1 pA for the set and reset switching, respectively, and a self-rectifying ratio as high as ∼105, which are suitable characteristics for low-power memristor applications. It also shows a forming-free characteristic. A charge-trap-associated switching model is proposed to account for this self-rectifying memrisive behavior. In addition, an asymmetric voltage scheme (AVS) to decrease the write power consumption by utilizing this self-rectifying memristor is also described. When the device is used in a 1000 × 1000 crossbar array with the AVS, the programming power can be decreased to 8.0% of the power consumption of a conventional biasing scheme. If the AVS is combined with a nonlinear selector, a power consumption reduction to 0.31% of the reference value is possible.Keywords: Low current; forming-free; low power; memristor; self-rectifying
Year: 2016 PMID: 27661260 DOI: 10.1021/acs.nanolett.6b01781
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189