| Literature DB >> 27639579 |
Pooria Namdari1, Hadis Daraee2, Ali Eatemadi3.
Abstract
The application of silicon nanowire (SiNW) biosensor as a subtle, label-free, and electrical tool has been extensively demonstrated by several researchers over the past few decades. Human ability to delicately fabricate and control its chemical configuration, morphology, and arrangement either separately or in combination with other materials as lead to the development of a nanomaterial with specific and efficient electronic and catalytic properties useful in the fields of biological sciences and renewable energy. This review illuminates on the various synthetic methods of SiNW, with its optical and electrical properties that make them one of the most applicable nanomaterials in the field of biomolecule sensing, photoelectrochemical conversion, and diseases diagnostics.Entities:
Keywords: Biomolecule sensing; Biosensor; Morphology; Silicon nanowires; Synthesis
Year: 2016 PMID: 27639579 PMCID: PMC5026984 DOI: 10.1186/s11671-016-1618-z
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
The performance of SiNW FET biosensors
| Device specification | Fabrication | Mechanism | Application | Detection limit |
|---|---|---|---|---|
| p-Type SiNW, diameter: 20 nm | Bottom–up | Biotin–avidin binding | Streptavidin | 10 pM |
| n-Type SiNW, p-type SiNW, diameter 20 nm | Bottom–up | Antibody–antigen interaction | PSA, CEA, Mucin-1 | PSA 2 fM, CEA 0.55 fM |
| p-Type SiNW, diameter 20 nm; p-type SiNW, diameter 20 nm | Bottom–up | PNA–DNA hybridization | DNA | 10 fM |
| p-Type SiNW, diameter 20 nm | Bottom–up | Antibody–virus interaction | Influenza A virus | Single virus |
| n-Type SiNW, p-type SiNW, thickness 40 nm, width 50–150 nm | Top–down | Biotin–avidin binding | Streptavidin | 10 fM |
| n-Type SiNW, p-type SiNW; thickness 40 nm, width: 50–150 nm | Top–down | Antibody–antigen interaction | PSA, CA 15.3 | PSA 2.5 ng/mL |
| n-Type SiNW, p-type SiNW, width 20 nm, length 30 nm | Top–down | DNA–DNA hybridization | DNA | 10 pM |
| n-Type SiNW, p-type SiNW, width 50 nm, length 20 nm | Top–down | DNA–DNA hybridization | DNA | 25 pM |
| n-Type SiNW, thickness ≤40 nm | Top–down | Antibody–antigen interaction | PSA | 30 aM |
| p-Type SiNW, diameter 30–60 nm | Bottom–up | Protein–protein interaction | TnI | 7 nM |
| n-Type SiNW, width 50 nm, thickness 60 nm, length 100 nm | Top–down | PNA–DNA hybridization | DNA | 10 fM |
| n-Type SiNW, width 50 nm, thickness 60 nm, length 100 nm | Top–down | Antibody–antigen interaction | cTnT | Ifg/mL |
| n-Type SiNW, width 50 nm, thickness 60 nm, length 100 nm | Top–down | PNA–DNA hybridization | RT-PCR product of DEN-2 | 10 fM |
| n-Type SiNW, width 50 nm, thickness 60 nm, length 100 nm | Top–down | PNA–RNA hybridization | microRNA | 1 fM |
| n-Type SiNW, width 50 nm, thickness 60 nm, length 100 nm | Top–down | Protein–DNA interaction | ER | 10 fM |
| n-Type SiNW, width 50 nm, thickness 60 nm, length 100 nm | Top–down | Antibody–antigen interaction | cTnT, CK-MM, CK-MB | 1 pg/mL |
Brief comparison of different SiNWs alignment methods
| Alignment type | Alignment method | Inter-NW distance, alignment yield and control of NW density | Merits | Demerits | References |
|---|---|---|---|---|---|
| Langmuir–Blodgett alignment | Parallel alignment of SiNWs during uniaxial compression of Langmuir–Blodgett trough | 8–10 NW/mm; | Alignment can be useful has a substrates spanning several cm2 in area. | Irreproducibility in the alignment direction of sINWs can lead to bad/weak end-to-end registration with the source and drain electrodes. | [ |
| Blown–bubble alignment | Suspension of SiNW–polymer solution blown into a bubble using gas flow | ca. 1 NW/3 mm | Alignment method can be applied to various SiNW materials like planar, plastic, curved. | Needs surface functionalization of SiNWs with epoxy group to form SiNW-polymer film, which may reduce the availability and efficiency of SiNW surface in terms of immobilization of biorecognition element | [ |
| Flow-based alignment | Microfluidic flow-driven shear forces, where the adsorption of NWs is facilitated by surface charge. | 2–3 NWs/mm | Cross-SINW arrays and equilateral triangles can be constructed using a chemically patterned surface and sequential layer-by-layer assembly steps with different flow directions. | Alignment is restricted to planar substrates and to small length scales ranging from few mm to cm. | [ |
| Electric-field based alignment | It involves balance of hydrodynamic and dielectrophoretic forces. | 1 NW/12 mm | There are no available incorporation issues of SiNWs with the source and drain contact electrodes. | It demands precise control of the hydrodynamic and dielectrophoretic forces. | [ |
| Contact printing alignment | Shear stress during the sliding of donor (the growth substrate) and receiver substrates. An intermediate step such as stamp transfer using a roller can also be employed (roll-transfer printing). | 4–8 NW/mm | Alignment viable with several SiNW materials and can be applied to diverse substrates (silicon, plastic and rubber etc.). | Lack of control in breakage of SiNWs during the transfer process, resulting in distribution of NW lengths. | [ |
Fig. 4Silicon nanowires via DEA fabrication process. Step (a) deposition of SiO2 by LPCVD. Step (b) reactive ion etching (RIE) in the Si3N4 layer. Step (c) Undercut the wet etch SiO2. Step (d) deposit the metal mask around the undercut region. Step (e) ion bean milling the metal mask. Step (f) hard-etch metal mask layer. Step (g) Remove the silicon nanoparticle. Step (h) Remove SiO2 Step (vii) the newly formed SiNW. This figure was reproduced from [30]
Fig. 5a Bottom–up approach synthesis of SiNWs. (i) Phase diagram for Fe–Si binary system. (ii) Schematic diagram showing synthesis of SiNWs via VLS growth and laser ablation cluster formation method. (iii) Growth profile for the synthesis of SiNWs. b TEM image of SiNWs synthesized through bottom–up approach using VLS techniques. c SEM image of SiNWs method via top–down approach. These figures were reproduced from [39] and [40]
Showing SiNWs synthesis techniques
| Techniques | Types | Material | References |
|---|---|---|---|
| Bottom–up approach (Fig. | Vapor-liquid-solid (VLS) | Coating-catalyzed metals on silicon substrate (CVD) | [ |
| Top–down approach (Fig. | None | Electron beam lithography | [ |
Differences between top–down and bottom–up approach synthesis of SiNWs
| Top–down approach | Bottom–up approach | |
|---|---|---|
| Device preparation | SiNW and device development were done by etching a silicon-on-insulator (SOI) wafer. | SiNWs are produced from molecular precursors by using a metal nano-cluster mediated VLS mechanism. |
| Fabrication techniques are developed from technology like optical lithography, reactive ion etching, e-beam lithography, and anisotropic wet etching | For a transmission electron microscope (TEM) image, check Fig. | |
| For a scanning electron microscope (SEM) image, check Fig. | ||
| Merits | Docile to mass production | Easiness in the choice of material for nanowire development |
| Alignment and directional control of the growth of nanowire crystal is possible [ | ||
| Dependability and reproducibility of the synthesizing process | Various doping levels and high availability of dopants can be introduced during the synthesis. | |
| No integration problems | There is high possibility of synthesizing SiNWs of diameter less than 10 nm. | |
| SiNWs with several cross sections like triangular [ | Appropriate for fabricating multilayer SiNW device structures | |
| SiNWs with double-gate structures that are reinforced on a co-planar geometry can be produced (improved sensitivity) [ | Flexible to incorporation with flexible and transparent device substrates [ | |
| Demerits | Demands a lot of time for processing | Leads to distribution of lengths and measurements of the synthesized SiNWs |
| Costly | Device development involves precise arrangement and positioning of SiNWs resulting to integration problems. | |
| Restricted choice of materials for SiNW fabrication | Extremely hard to realize accurate control of number of SiNWs bridging the source and drain electrodes resulting to disparities in batch-to-batch fabrication of SiNW devices | |
| Incompatibility of surface chemistry with the tough processing of nanofabrication | Alignment problems related with long SiNWs | |
| Measurements of SiNWs restricted by the resolution of the fabrication process | Mass production of SiNW devices almost impossible |
Fig. 1The silicon nanowire biosensor synthesis using VLS method via CVD method: Step (i) Gold nanoparticle deposition. Step (ii) Reduction of silane gas to silicon vapor. Step (iii) Diffusion of silicon vapor via gold nanoparticles. Step (iv) Formation of SiNWs via super-saturation with silicon. This figure was reproduced from [7]
Fig. 2a Illustrated diagram showing synthesis of SiNWs via OAG method. b SEM image of synthesis of SiNWs via OAG method. These figures were reproduced from [9]
Fig. 3Silver-assisted chemical etching mechanism: Step (i) Deposition of silver nanoparticles on silicon surface. Step (ii) Generation of holes via the oxidation of silicon and etching by HF. Step (iii) Formation of SiNWs arrays leads to silver nanoparticle sinking. Step (iv) Newly formed SiNWs. The figure was reproduced from [15]
Fig. 6Showing band gap as a function of the silicon nanowire diameter for various surface terminations. a DFT calculations within GGA-PBE. b Results from a density-functional tight-binding (DFTB) parameterization. This figure was reproduced from [41]
Fig. 7a Scanning electron microscopy of a tapered nanowire. b Optical dark field image of the nanowire and theoretical calculation of the scattering efficiency of the nanowire for a wavelength of 633 nm as a function of the diameter. This figure was reproduced from [45]
Showing selected applications of DNA-based SiNW-FET sensors
| Capture probe (target length) | Limit of detection (LOD) | Buffer composition, ionic strength, Debye screening length | Description | Reference |
|---|---|---|---|---|
| DNA (16 BP) | 10 pM | 1 SSC, 165 mM, ca. 1 nm | Electrostatically adsorbed capture probe, oxide layer removed by etching | [ |
| PNA (22 BP) | 10 fM | 0.01 SSC, 1.65 mM, 7.0 nm | Oxide layer removed by chemical etching and SiNW surface passivated with an organic film | [ |
| PNA (22 BP) | 1 fM | 0.01 SSC, 1.65 mM, 7.0 mm | Electrostatically neutral analog of DNA as a capture probe | [ |
| DNA (19 BP) | 1 fM | 0.1 PBS, 15 mM, 2.3 nm | Small size of SiNWs achieved by implementation of NW structures with triangular cross section | [ |
| DNA (24 BP) | 0.1 fM | 0.01 PBS, 1.5 mM, 7.3 nm | Triangularly shaped SiNW-FETs operated at “subthreshold” regime | [ |
| DNA (15 BP) | 0.1 fM | 0.01 PBS, 1.5 mM, 7.3 nm | Alignment of interfacial chemistry by electric field | [ |
| DNA (30 BP) | 50 aM | 0.1 PBS, 15 mM, 2.3 nm | RCA amplification | [ |
Showing application of SiNWs in sensor technologies
| Methods | Application | Reference |
|---|---|---|
| Surface-enhanced Raman scattering | Amoxicillin, calcium dipicolinate, protein, immunoglobulin | [ |
| Fluorescence sensor | Multiplex DNA detection | [ |
| Protein immunosensor | [ | |
| [ | ||
| NO detection | [ | |
| Ln (III) detection | ||
| Electrochemical sensor | H2O2 detection | [ |
| Dopamine | [ | |
| Glutathione | ||
| BSA | [ | |
| Field effect transistors | DNA detection and hybridization | [ |
| CRP and PSA detection | [ | |
| Lectin EC detection | [ | |
| Interleukin-I genes | [ | |
| Influenza virus | [ |
Fig. 8SiNW sensor for pH measurements. (i) Graphics representation of an APTES modified SiNW. (ii) Real-time modifications in conductance response of APTES-modified p-type SiNW. (iii) Graphics representation of an unmodified SiNW. (iv) Conductance response of an unmodified SiNW as a function of pH. This figure was reproduced from [51]
Fig. 11Illustrated diagram showing preparation of silicon-based nano-MBs for DNA analysis. Step (i) Fabricating AuNP-decorated with SiNWs with SH-FAM stem loop DNA. Step (ii) Reaction with target DNA. This figure was produced from [63]
Fig. 9Illustrated diagram of surface enhanced Raman scattering (SERS) sensor-based SiNWs/AgNPs for DNA detection. Step (i) DNA capture by SH. Step (ii) Addition of reporter DNA. Step (iii) Targeting DNA. Step (iv) Graphical illustration of target DNA and DNANC. This figure was reproduced from [57]
Fig. 10a Showing photograph of the detection of pesticide deposits on a cucumber surface experiment. b Showing Raman spectra documented from the rough cucumber surface with 1-s gain time and ×50 objective. c Showing photograph of SiNWs compiled on a commercially available filter film and graphic picture of the E. coli detection. d Showing Raman spectra documented from a blank thin film and five different sites on the E. coli-contaminated AgNP@SiNWs thin film with 10-s acquisition time and ×50 objective. This figure was reproduced from [58]
Fig. 12Illustrated graph showing fluorescence intensity of various concentrations of complementary target DNA with the complementary bar at 10 nM showing the highest fluorescence intensity and the background bar showing the lowest fluorescence intensity. This figure was produced from [65]
Fig. 13Schematic graph showing change in fluorescence intensity with concentration of FITC-anti IgG. These figures were reproduced from [34]
Fig. 14Schematic graph showing change in fluorescence intensity with concentration of Cy3-anti IgM. These figures were reproduced from [67]
Fig. 15Showing a schematic plots of normalized current change against time with target DNA at various concentrations for probe DNA modified SiNW device. This figure was reproduced from [34]
Fig. 16Showing schematic diagram of the SiNW biosensor for free detection of carbohydrate-protein interaction. This figure was reproduced from [67]