| Literature DB >> 27624819 |
A N Anisimov1, D Simin2, V A Soltamov1, S P Lebedev1,3, P G Baranov1, G V Astakhov2, V Dyakonov2,4.
Abstract
We report a giant thermal shift of 2.1 MHz/K related to the excited-state zero-field splitting in the silicon vacancy centers in 4H silicon carbide. It is obtained from the indirect observation of the optically detected magnetic resonance in the excited state using the ground state as an ancilla. Alternatively, relative variations of the zero-field splitting for small temperature differences can be detected without application of radiofrequency fields, by simply monitoring the photoluminescence intensity in the vicinity of the level anticrossing. This effect results in an all-optical thermometry technique with temperature sensitivity of 100 mK/Hz(1/2) for a detection volume of approximately 10(-6) mm(3). In contrast, the zero-field splitting in the ground state does not reveal detectable temperature shift. Using these properties, an integrated magnetic field and temperature sensor can be implemented on the same center.Entities:
Year: 2016 PMID: 27624819 PMCID: PMC5022017 DOI: 10.1038/srep33301
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Indirect detection of the ES spin resonance in the VSi center of 4H-SiC.
(a) The GS and ES spin sublevels in the external magnetic field. The arrows labeled as ν1, ν2 and ν5 indicate the RF driven transitions in the GS, detected in the experiment. (b–d) Magnetic field dependence of the VSi ODMR spectra in the vicinity of the ESLAC-1, performed at different temperatures. The arrows indicate the magnetic field BE1, at which the minimum ODMR contrast of the ν1 transition is observed.
Figure 2The GS (2D) and ES (2D) ZFS in the VSi center of 4H-SiC as a function of temperature.
Solid symbols are observed from the ODMR experiments of Fig. 1 and open symbols from the LAC experiments of Fig. 3. The line for 2D is a fit to Eq. (1). The line for 2D is to guide the eye.
Figure 3Lock-in detection of the PL variation ΔPL/PL (in-phase voltage U normalized to the dc photovoltage) as a function of the dc magnetic field B, recorded at different temperatures.
ΔPL is caused by the application of an additional weak oscillating magnetic field. The arrows indicate the characteristic magnetic fields of different LACs. RF is not applied.