| Literature DB >> 27620067 |
Jakub Szlachetko1,2, Joanna Hoszowska3, Jean-Claude Dousse3, Maarten Nachtegaal1, Wojciech Błachucki3, Yves Kayser1, Jacinto Sà4,5, Marc Messerschmidt6,7, Sebastien Boutet6, Garth J Williams6,8, Christian David1, Grigory Smolentsev1, Jeroen A van Bokhoven1,9, Bruce D Patterson1, Thomas J Penfold1, Gregor Knopp1, Marek Pajek2, Rafael Abela1, Christopher J Milne1.
Abstract
X-ray techniques have evolved over decades to become highly refined tools for a broad range of investigations. Importantly, these approaches rely on X-ray measurements that depend linearly on the number of incident X-ray photons. The advent of X-ray free electron lasers (XFELs) is opening the ability to reach extremely high photon numbers within ultrashort X-ray pulse durations and is leading to a paradigm shift in our ability to explore nonlinear X-ray signals. However, the enormous increase in X-ray peak power is a double-edged sword with new and exciting methods being developed but at the same time well-established techniques proving unreliable. Consequently, accurate knowledge about the threshold for nonlinear X-ray signals is essential. Herein we report an X-ray spectroscopic study that reveals important details on the thresholds for nonlinear X-ray interactions. By varying both the incident X-ray intensity and photon energy, we establish the regimes at which the simplest nonlinear process, two-photon X-ray absorption (TPA), can be observed. From these measurements we can extract the probability of this process as a function of photon energy and confirm both the nature and sub-femtosecond lifetime of the virtual intermediate electronic state.Entities:
Year: 2016 PMID: 27620067 PMCID: PMC5020491 DOI: 10.1038/srep33292
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Experimental setup for nonlinear two-photon X-ray absorption spectroscopy.
(a) schematics of the experimental setup showing the Kirkpatrick-Baez (KB) mirror focusing scheme and high energy resolution X-ray emission geometry. The X-ray emission data were recorded for different X-ray pulse fluence by moving the sample along the focus direction of the KB mirrors. (b) High energy resolution X-ray emission spectra recorded at an energy 12 eV below the K-shell ionization threshold of Cu for different incident X-ray fluences. The directions of spectral intensity changes with increasing X-ray pulse fluence are marked by black-dashed (HEROS) and red arrows (Kα emission), respectively. The spectrum difference between highest and lowest X-ray pulse fluence is plotted in bottom panel. (c) Schematic representation of radiative OPA (black arrows) and TPA (red arrows) processes in the off-resonant regime (E < E). While for the OPA process the emitted X-ray energy (E) relates directly to the incoming X-ray energy (E), the TPA mechanism leads to an ionization event and therefore the emitted X-ray energy is constant and equal to the energy difference between the initial (E) and final (E) electronic states. The E and E correspond to absolute values of the electron binding energies, and E is the energy of the photo-excited electron. The virtual intermediate state and the initial state are characterized by lifetimes marked by τ and τ, respectively.
Figure 2Determined X-ray transition rates at incidence X-ray energy of 8967 eV as a function of applied X-ray flux for TPA and OPA signals.
Blue and red solid lines represent the quadratic/linear function fits to the experimental data. The dashed lines correspond to calculated rates using a model for a three-level system (for details see text).
Figure 3TPA cross-sections as a function of the incoming X-ray energy (blue circles).
The line is a result of fitting the OPA cross-section dependence to experimental data points. The blue area represents the uncertainties related to the TPA cross section curve.