| Literature DB >> 27607842 |
Fan Ye1, Jaesung Lee1, Jin Hu2, Zhiqiang Mao2, Jiang Wei2, Philip X-L Feng1.
Abstract
The ambient environmental instability and degradation mechanism of single- and few-layer WTe2 are investigated. Oxidation of W and Te atoms appears to be a main reason for degradation. Single-layer samples' Raman signals disappear within 20 min in air. Few-layer WTe2 exhibits saturating degradation behavior: only the top layer WTe2 is oxidized; the degraded layer can protect inner layers from further degradation.Entities:
Keywords: 2D semiconductors; AES; Raman; degradation; nanosheets; tungsten ditelluride (WTe2)
Year: 2016 PMID: 27607842 DOI: 10.1002/smll.201601207
Source DB: PubMed Journal: Small ISSN: 1613-6810 Impact factor: 13.281