Literature DB >> 27606926

Directed self-assembly of high-chi block copolymer for nano fabrication of bit patterned media via solvent annealing.

Shisheng Xiong1, Yves-Andre Chapuis, Lei Wan, He Gao, Xiao Li, Ricardo Ruiz, Paul F Nealey.   

Abstract

We report the formation of nanoimprint master templates that can be used for the fabrication of bit patterned media (BPM). The template was formed by directed self-assembly, with solvent annealing, of a symmetric ABA triblock copolymer to form perpendicularly oriented lamellae on chemical patterns. We used a high-χ block copolymer, poly(2-vinyl pyridine)-block-polystyrene-block-poly(2-vinyl pyridine) to achieve smaller feature sizes than are possible with polystyrene-block-poly(methyl methacrylate). The work shows that triblock copolymers can provide a large processing window in terms of pitch commensurability. Using block-selective infiltration (atomic layer deposition with sequential long soaking/purge cycles), an alumina composite with high etch resistance was specifically incorporated into the polar and hydrophilic P2VP domains. Subsequently, the surface pattern was successfully transferred into underlying Si substrates by etching with a fluorine-containing plasma to create a nanoimprint master. The line/space pattern of the nanoimprint master met the BPM fabrication requirement of defectivity <10(-3). For demonstration purposes, the nanoimprint master was used to imprint a replica pattern of photoresist on a quartz wafer.

Entities:  

Year:  2016        PMID: 27606926     DOI: 10.1088/0957-4484/27/41/415601

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  2 in total

1.  The Influence of Additives on the Interfacial Width and Line Edge Roughness in Block Copolymer Lithography.

Authors:  Daniel F Sunday; Xuanxuan Chen; Thomas R Albrecht; Derek Nowak; Paulina Rincon Delgadillo; Takahiro Dazai; Ken Miyagi; Takaya Maehashi; Akiyoshi Yamazaki; Paul F Nealey; R Joseph Kline
Journal:  Chem Mater       Date:  2020       Impact factor: 9.811

2.  Poly(styrene)-block-Maltoheptaose Films for Sub-10 nm Pattern Transfer: Implications for Transistor Fabrication.

Authors:  Anette Löfstrand; Reza Jafari Jam; Karolina Mothander; Tommy Nylander; Muhammad Mumtaz; Alexei Vorobiev; Wen-Chang Chen; Redouane Borsali; Ivan Maximov
Journal:  ACS Appl Nano Mater       Date:  2021-05-13
  2 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.