| Literature DB >> 27569400 |
Yucheng Liu1, Yunxia Zhang1, Zhou Yang2, Dong Yang1, Xiaodong Ren1, Liuqing Pang1, Shengzhong Frank Liu3,4.
Abstract
Thinness-controlled perovskite wafers are directly prepared using a geometry-regulated dynamic-flow reaction system. It is found that the wafers are a superior material for photodetectors with a photocurrent response ≈350 times higher than that made of microcrystalline thin films. Moreover, the wafers are compatible with mass production of integrated circuits.Entities:
Keywords: controlled growth; perovskites; photodetectors; ultrathin; wafers
Year: 2016 PMID: 27569400 DOI: 10.1002/adma.201601995
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849