| Literature DB >> 27551603 |
C Doll1, H G Börner2, T von Egidy1, H Fujimoto3, M Jentschel2, H Lehmann2.
Abstract
The construction of the double-crystal γ-spectrometer GAMS5 was finished recently and the instrument is now operational. Measurements with double flat crystals were carried out and we will report here on the progress concerning the characteristics of the spectrometer.Entities:
Keywords: crystal diffraction; gammaray spectrometer; nuclear spectroscopy
Year: 2000 PMID: 27551603 PMCID: PMC4878342 DOI: 10.6028/jres.105.023
Source DB: PubMed Journal: J Res Natl Inst Stand Technol ISSN: 1044-677X
Fig. 1Development of the angular resolution on the Grenoble crystal-spectrometers over the last 25 years. The upper curve shows the progress on bent crystals whereas the lower curve represents flat crystals.
Fig. 2View of one of the interferometer-arms where a flat crystal is mounted.
Fig. 3Scatter of the angular distances between the dispersive and nondispersive reflection of a 517 keV transition in 36Cl. This plot shows that within statistics the relative error is smaller than 2 × 10−7.
Fig. 4Measurement of the long-range (over ≈ 1°) nonlinearity. The plot shows the deviations from the average of the peak-positions for different reflection-orders plotted over the angle. Within statistics no deviations of the linearity are observed.
Fig. 5The instrumental resolution on the GAMS5 spectrometer, measured with flat, 2.7 mm thick Si crystals. The curve shown is for the 816 kev line in 168Er recorded using the Si (660) reflection. The shaded area shows the shape calculated from dynamical diffraction theory. The data points are fitted to a curve which is the dynamical diffraction theory folded with a gaussian (instrumental broadening) of 0.006″. This instrumental broadening of 0.006″ corresponds for this energy to an energy resolution of . On the abscess scale 1 fringe = 0.040″.
Fig. 6View of one of the devices which are used to bend the crystals.