| Literature DB >> 27536725 |
Kenta Takeda1, Jun Kamioka2, Tomohiro Otsuka1, Jun Yoneda1, Takashi Nakajima1, Matthieu R Delbecq1, Shinichi Amaha1, Giles Allison1, Tetsuo Kodera2, Shunri Oda2, Seigo Tarucha3.
Abstract
Fault-tolerant quantum computing requires high-fidelity qubits. This has been achieved in various solid-state systems, including isotopically purified silicon, but is yet to be accomplished in industry-standard natural (unpurified) silicon, mainly as a result of the dephasing caused by residual nuclear spins. This high fidelity can be achieved by speeding up the qubit operation and/or prolonging the dephasing time, that is, increasing the Rabi oscillation quality factor Q (the Rabi oscillation decay time divided by the π rotation time). In isotopically purified silicon quantum dots, only the second approach has been used, leaving the qubit operation slow. We apply the first approach to demonstrate an addressable fault-tolerant qubit using a natural silicon double quantum dot with a micromagnet that is optimally designed for fast spin control. This optimized design allows access to Rabi frequencies up to 35 MHz, which is two orders of magnitude greater than that achieved in previous studies. We find the optimum Q = 140 in such high-frequency range at a Rabi frequency of 10 MHz. This leads to a qubit fidelity of 99.6% measured via randomized benchmarking, which is the highest reported for natural silicon qubits and comparable to that obtained in isotopically purified silicon quantum dot-based qubits. This result can inspire contributions to quantum computing from industrial communities.Entities:
Keywords: Nanotechnology; Si/SiGe; Silicon; physics; quantum dot; qubit; spin qubit
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Year: 2016 PMID: 27536725 PMCID: PMC4982751 DOI: 10.1126/sciadv.1600694
Source DB: PubMed Journal: Sci Adv ISSN: 2375-2548 Impact factor: 14.136
Fig. 1Device structure and EDSR measurement result.
(A) False-color scanning electron micrograph of the device. The orange boxes represent ohmic contacts that are grounded during the measurements except for the one connected to the resonance circuit. The two small circles show the approximate position of the double quantum dot, and the large circle shows the approximate position of the sensor quantum dot. Three of the gate electrodes (R, L, and C) are connected to impedance-matched high-frequency lines with cryogenic bias tees. (B) Schematic of the pulse sequence used for the EDSR measurement. The pulse sequence consists of four stages, namely, initialization, control, readout, and emptying. (C) Charge stability diagram in the vicinity of the (1,1) charge configuration. MR,IR (ML,IL) denote the measurement and initialization points for the right (left) quantum dot. O denotes the operation point that is common for both right and left quantum dots. a.u., arbitrary units. (D) Measurement of the EDSR signal as a function of fMW and Bext. The blue line corresponds to the left dot resonance condition hfMW = gμ(Bext + ), and the red line corresponds to the right dot resonance condition hfMW = gμ(Bext + ). (E) Rabi oscillation with ~ 8 μs and fRabi ~ 9 MHz measured at Bext = 0.505 T and fMW = 15.6055 GHz. The red triangles show measurement data, and the black solid line shows the fitting with an exponentially damped sine curve, with A, B, fRabi, θ, and as fitting parameters. (F) Measurement result of detuned Rabi oscillations, which shows a typical chevron pattern.
Fig. 2Ramsey interference measurements.
(A) Schematic of the Ramsey measurement sequence. ϕ denotes the phase of the second microwave burst relative to the first Xπ/2 rotation. A rectangle or Gaussian microwave burst is applied to gate C. (B) Ramsey fringes measurement result. Bext is fixed at 0.505 T. ϕ is the phase of the second microwave burst relative to the first microwave burst. (C) Ramsey fringes decay envelope extracted by sweeping fMW at each fixed tw. The black solid line is a fit with a Gaussian decay function , where A and B are constants to account for the measurement and initialization fidelities. (D) Demonstration of the π/2 pulse around an arbitrary rotation axis in the xy plane of the Bloch sphere.
Fig. 3Rabi oscillation power dependence.
(A) Microwave amplitude dependence of Rabi oscillations measured at Bext = 0.505 T and fMW = 15.6055 GHz. (B) Microwave amplitude dependence of the Rabi frequency fRabi. The red triangles show the measured data, and the black dotted line shows a linear fitting for the small-amplitude data (0.1 ≤ AMW ≤ 0.25). The fitting error is smaller than the size of the symbols. (C) Microwave amplitude dependence of the Rabi decay time . Because the total evolution time of the data used for the fitting is relatively short (tp = 3 μs), it shows large errors for small AMW points. (D) Microwave amplitude dependence of the quality factor . The error mainly comes from the uncertainty of .
Fig. 4Randomized benchmarking measurement.
(A) Schematic of the randomized benchmarking sequence. The upper panel is a reference sequence consisting of m random Clifford gates. The lower panel is the interleaved sequence used to measure fidelities of a specific test Clifford gate Ctest. The sequence is repeated for k = 16 choices of sequences to obtain one point. (B) Reference randomized benchmarking for two different microwave amplitudes. The inset shows the quality factor measurement for Gaussian microwave burst, which shows a result that is similar to the one for rectangle microwave burst. (C) Interleaved randomized benchmarking for single-step Clifford gates. The table on the right shows fidelity measurement results for several single-qubit gates. The fitting error of each gate fidelity is smaller than 0.1% for the reference and all interleaving measurements.