| Literature DB >> 27514318 |
Batirtze Prats-Mateu1, Notburga Gierlinger1.
Abstract
Scanning probe microscopies and spectroscopies, especially AFM and Confocal Raman microscopy are powerful tools to characterize biological materials. They are both non-destructive methods and reveal mechanical and chemical properties on the micro and nano-scale. In the last years the interest for increasing the lateral resolution of optical and spectral images has driven the development of new technologies that overcome the diffraction limit of light. The combination of AFM and Raman reaches resolutions of about 50-150 nm in near-field Raman and 1.7-50 nm in tip enhanced Raman spectroscopy (TERS) and both give a molecular information of the sample and the topography of the scanned surface. In this review, the mentioned approaches are introduced, the main advantages and problems for application on biological samples discussed and some examples for successful experiments given. Finally the potential of colocated AFM and Raman measurements is shown on a case study of cellulose-lignin films: the topography structures revealed by AFM can be related to a certain chemistry by the colocated Raman scan and additionally the mechanical properties be revealed by using the digital pulsed force mode. Microsc. Res. Tech. 80:30-40, 2017.Entities:
Keywords: AFM; TERS; biological materials; co-located AFM Raman; confocal Raman microscopy; nanochemistry; nanomechanics; near-field Raman; scanning probe microscopies
Mesh:
Substances:
Year: 2016 PMID: 27514318 PMCID: PMC5217061 DOI: 10.1002/jemt.22744
Source DB: PubMed Journal: Microsc Res Tech ISSN: 1059-910X Impact factor: 2.769
Figure 1Working principle of atomic force microscopy (AFM) in digital pulsed force mode (DPFM). The cantilever oscillates free with a sinusoidal modulation at lower frequencies than its resonance frequency. At very short distances from the sample surface, the tip snaps into the sample. The repulsive forces increase as the tip pushes towards the sample and they reach a maximum (F max). From the slope of the “indentation” in the repulsive regime decreases and attractive forces originate between tip and sample, which in turn corresponds to the adhesive local forces between them. When the spring constant of the tip overcomes the adhesion forces, the tip snaps out and a new cycle begins. The baseline corresponds to long range forces and must be set to zero before any read out of absolute values.
Figure 2Operation principles when combining surface probe microscopies (SPM) and Raman spectroscopy. Best interpretable Chemical information is achieved applying conventional Confocal Raman microscopy, but spatial resolution is limited by the diffraction of light. Near‐Field Raman microscopy and tip enhanced Raman spectroscopy (TERS) overcome this limitation, but are more difficult to be operated on complex biological systems. Atomic force microscopy (AFM) gives structural and mechanical information on the nanoscale and is therefore in combination with Raman microscopy an important tool to reveal structure–function relationships.
Characteristics of the different Raman‐AFM operation modes
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| Near‐field Raman (∼aperture size) | TERS (∼tip radius) | AFM (∼tip radius) | ||
|---|---|---|---|---|---|
| SERS | |||||
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| 250 nm–1 µm | 50–150 nm | 1.7–50 nm | 1–10 nm STM: atomic resolution | |
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| 700 nm | 1–100 nm | 1–100 nm | ||
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| –Smooth surface –No height requirements | –Flatness –Depending on the set up: transparent samples | –Smooth surface –Depending on the set up: transparent samples | –No big topographical jumps | |
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| –Depth scans, high speed –No need of labelling –Measurement in aqueous environments –Inverted set up especially suitable for cell culture measurements | –Signal enhancement up to 1014 | –Chemistry with high lateral resolution | –Chemistry with high lateral resolution –Enhanced Raman spectra | –Many properties possible (topography, mechanics, chemistry…) –Operates in air, liquid, vacuum |
|
| –Out of focus –Burning –Change of chemistry due to laser | –Nanoparticles not homogenously distributed | –In reflexion topography affects signal intensity | –Topography effects cause different signal enhancement –Tip contamination –Sample heating can lead to irreversible changes | –Tip broadening (tip contamination) –Tip breakage –Smoothing of sharp borders |
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| –Z scans not possible in opaque samples, –Sample fluorescence | –Low reproducibility –Enhancement depends on many factors (nanoparticles, sample chemistry and surface) | –In transmission more reproducible, but thin samples necessary –Low signal | –Low reproducibility –Specimen overheating –Tip breakage –Enhanced Raman spectra difficult to interpret –Expensive tips (Au, Ag), no mass production | –Surface studies only –Tip breakage |
Figure 3A case study of colocated confocal Raman microscopy (CRM) and atomic force microscopy (AFM). (A) AFM topography image of a film of cellulose nanocrystals (CNCs) and lignin dehydrogenation polymer (DHP) casted on a quartz window. (B) Combined false colour image based on band integration over the main aromatic stretching band at 1,600 cm−1 (lignin) (in red) and the main cellulose band at 380 cm−1 (in blue). (C) Average Raman spectra of the red (lignin agglomeration) and blue (cellulose rich) regions shown in B).
Figure 4High resolution digital pulsed force mode (DPFM) on a lignin dehydrogenation polymer (DHP) agglomerate. AFM images in DPFM show (A) Topography and different mechanical properties: (B) F max (maximum force between tip and sample), (C) Local adhesion, and (D) Stiffness. For F max, Adhesion and Stiffness, note that the values are not corrected for the tip‐sample contact area and they are plotted in relative units (minimum at 0 values, maximum at 1). The maximum force (F max) was calculated assuming that its values in DPFM (sinusoidal modulation) are homologous to the maximum force in a force‐distance curve with triangular modulation and taking into account the spring constant and the sensitivity of the cantilever.