Refined treatment of single-edge diffraction effects in radiometry.

This work treats diffraction corrections in radiometry for cases of point and extended sources in cylindrically symmetrical three-element systems. It considers diffraction effects for spectral power and total power in cases of Planck sources. It improves upon an earlier work by the author by giving a simpler rendering of leading terms in asymptotic expansions for diffraction effects and reliable estimates for the remainders. This work also demonstrates a framework for accelerating the treatment of extended sources and simplifying the calculation of diffraction effects over a range of wavelengths. This is especially important in the short-wavelength region, where dense sampling of wavelength values is in principle necessitated by the rapidly oscillatory behavior of diffraction effects as a function of wavelength. We demonstrate the methodology's efficacy in two radiometric applications.