Literature DB >> 27475563

Calibration of higher eigenmodes of cantilevers.

Aleksander Labuda1, Marta Kocun1, Martin Lysy2, Tim Walsh1, Jieh Meinhold1, Tania Proksch1, Waiman Meinhold1, Caleb Anderson1, Roger Proksch1.   

Abstract

A method is presented for calibrating the higher eigenmodes (resonant modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating the first eigenmode by providing the higher-mode stiffness as a ratio to the first mode stiffness. A one-time calibration routine must be performed for every cantilever type to determine a power-law relationship between stiffness and frequency, which is then stored for future use on similar cantilevers. Then, future calibrations only require a measurement of the ratio of resonant frequencies and the stiffness of the first mode. This method is verified through stiffness measurements using three independent approaches: interferometric measurement, AC approach-curve calibration, and finite element analysis simulation. Power-law values for calibrating higher-mode stiffnesses are reported for several cantilever models. Once the higher-mode stiffnesses are known, the amplitude of each mode can also be calibrated from the thermal spectrum by application of the equipartition theorem.

Year:  2016        PMID: 27475563     DOI: 10.1063/1.4955122

Source DB:  PubMed          Journal:  Rev Sci Instrum        ISSN: 0034-6748            Impact factor:   1.523


  3 in total

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Journal:  Data Brief       Date:  2016-11-24

2.  Quantifying High-Performance Material Microstructure Using Nanomechanical Tools with Visual and Frequency Analysis.

Authors:  Emil Sandoz-Rosado; Michael R Roenbeck; Kenneth E Strawhecker
Journal:  Scanning       Date:  2018-07-12       Impact factor: 1.932

3.  Realization and direct observation of five normal and parametric modes in silicon nanowire resonators by in situ transmission electron microscopy.

Authors:  Feng-Chun Hsia; Dai-Ming Tang; Wipakorn Jevasuwan; Naoki Fukata; Xin Zhou; Masanori Mitome; Yoshio Bando; Torbjörn E M Nordling; Dmitri Golberg
Journal:  Nanoscale Adv       Date:  2019-02-26
  3 in total

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