| Literature DB >> 27459319 |
Thomas A Celano1, David J Hill1, Xing Zhang1, Christopher W Pinion1, Joseph D Christesen1, Cory J Flynn1, James R McBride2, James F Cahoon1.
Abstract
Semiconductor nanowires (NWs) have been demonstrated as a potential platform for a wide-range of technologies, yet a method to interconnect functionally encoded NWs has remained a challenge. Here, we report a simple capillarity-driven and self-limited welding process that forms mechanically robust and Ohmic inter-NW connections. The process occurs at the point-of-contact between two NWs at temperatures 400-600 °C below the bulk melting point of the semiconductor. It can be explained by capillarity-driven surface diffusion, inducing a localized geometrical rearrangement that reduces spatial curvature. The resulting weld comprises two fused NWs separated by a single, Ohmic grain boundary. We expect the welding mechanism to be generic for all types of NWs and to enable the development of complex interconnected networks for neuromorphic computation, battery and solar cell electrodes, and bioelectronic scaffolds.Keywords: Ohmic junction; Silicon nanowires; capillarity-driven welding; finite-element simulation; percolation network; surface diffusion
Year: 2016 PMID: 27459319 DOI: 10.1021/acs.nanolett.6b02361
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189