| Literature DB >> 27410088 |
Ricardo Janeiro, Raquel Flores, Pabitra Dahal, Jaime Viegas.
Abstract
We report the fabrication of a phase photon sieve (PS) on the tip of a standard single mode fiber by focused ion beam (FIB) milling. The fiber tip was dip-coated with a conductive polymer ( PEDOT: PSS) as an alternative, more advantageous method to the metallization prior to FIB milling. The near field scans of the intensity profile along the optical axis under fiber illumination of a laser at λ = 1.55 μm are presented. We have analyzed the focusing properties and demonstrated the validity of our structure for light coupling into silicon photonics waveguides with improved efficiency and alignment tolerance.Entities:
Year: 2016 PMID: 27410088 DOI: 10.1364/OE.24.011611
Source DB: PubMed Journal: Opt Express ISSN: 1094-4087 Impact factor: 3.894