| Literature DB >> 27399874 |
Jae Joon Kim1, Jun Mok Ha1, Hyeok Moo Lee2, Hamid Saeed Raza3, Ji Won Park1, Sung Oh Cho1.
Abstract
The effects of electron-beam irradiation on the organic semiconductor rubrene and its application as a dosimeter was investigated. Through the measurements of photoluminescence and the ultraviolet photoelectron spectroscopy, we found that electron-beam irradiation induces n-doping of rubrene. Additionally, we fabricated rubrene thin-film transistors with pristine and irradiated rubrene, and discovered that the decrease in transistor properties originated from the irradiation of rubrene and that the threshold voltages are shifted to the opposite directions as the irradiated layers. Finally, a highly sensitive and air-stable electron dosimeter was fabricated based on a rubrene transistor.Entities:
Keywords: dosimeter; electron-beam irradiation; organic thin-film transistor; rubrene; semiconductor doping
Year: 2016 PMID: 27399874 DOI: 10.1021/acsami.6b05555
Source DB: PubMed Journal: ACS Appl Mater Interfaces ISSN: 1944-8244 Impact factor: 9.229