| Literature DB >> 27386575 |
Andrej Singer1, Leandra Boucheron1, Sebastian H Dietze1, Katharine E Jensen2, David Vine3, Ian McNulty4, Eric R Dufresne2, Richard O Prum2, Simon G J Mochrie2, Oleg G Shpyrko1.
Abstract
Many organisms in nature have evolved sophisticated cellular mechanisms to produce photonic nanostructures and, in recent years, diverse crystalline symmetries have been identified and related to macroscopic optical properties. However, because we know little about the distributions of domain sizes, the orientations of photonic crystals, and the nature of defects in these structures, we are unable to make the connection between the nanostructure and its development and functionality. We report on nondestructive studies of the morphology of chitinous photonic crystals in butterfly wing scales. Using spatially and angularly resolved x-ray diffraction, we find that the domains are highly oriented with respect to the whole scale, indicating growth from scale boundaries. X-ray coherent diffractive imaging reveals two types of crystalline domain interfaces: abrupt changes between domains emerging from distinct nucleation sites and smooth transitions with edge dislocations presumably resulting from internal stresses during nanostructure development. Our study of the scale structure reveals new aspects of photonic crystal growth in butterfly wings and shows their similarity to block copolymer materials. It opens new avenues to exploration of fundamental processes underlying the growth of biological photonic nanostructures in a variety of species.Entities:
Keywords: Photonic crystals; biophotonics; coherent x-ray imaging; topological defects; x-ray diffraction
Mesh:
Year: 2016 PMID: 27386575 PMCID: PMC4928966 DOI: 10.1126/sciadv.1600149
Source DB: PubMed Journal: Sci Adv ISSN: 2375-2548 Impact factor: 14.136
Fig. 1Experimental description.
(A) An image of the T. imperialis (Kaiser-i-Hind) butterfly (). (B) A schematic of the experiment. X-ray radiation (1.8-keV photon energy) is generated by the undulator source and spatially filtered by a 5-μm pinhole. The sample is positioned behind the pinhole, and the detector records coherently scattered radiation. A semitransparent beam stop mounted on a metallic wire was used. (C) An optical micrograph of a single wing scale. (D and E) Typical diffraction patterns recorded from different sample areas with x-rays incident normal to the scale. Insets to (D) and (E) show the intensity in the vicinity of the (110) Bragg peaks. Scale bars, 5 cm (A), 50 μm (C), and 0.05 nm−1 (D and E).
Fig. 2A representation of the whole scale oriented similarly to Fig. 1C.
(A) The angle α between the x axis and a {110} peak (see Fig. 1D) as a function of the position across the scale. An average over all six angles (modulo 60°) is shown. (B) The angle β between the z axis (out of plane of the image) and vector n111 normal to the determined hexagonal set of peaks. (C) The angle γ between the x axis and the projection of n111 onto the xy plane. (D) The thickness of the crystallites determined from the x-ray diffraction data recorded by rocking the scale through the beam. Scale bar, 10 μm; the region for the ptychographic scan is indicated by the black square and the histograms of the angles are shown on the right of the color bars. In (B) to (D), Gaussian fits to the histograms are also shown with centers (RMS widths) of 14° ± 1° (5° ± 1°) (B), 91° ± 1° (20° ± 1°) (C), and 3.0 ± 0.1 μm (0.7 ± 0.1 μm) (D). Angles are positive for clockwise rotation.
Fig. 3Result from ptychographic reconstruction.
(A) An image of the scale indicated by a black rectangle in Fig. 2 (absorption or reconstructed amplitudes). The color corresponds to the crystal orientation modulo 60° (see color wheel), and edge dislocations are indicated. (B) Zoomed-in image of the region indicated by the white square in (A). The solid line highlights the domain boundary accommodated by edge dislocations between the red (average angle, 52° ± 2°) and the dark red (average angle, 57° ± 3°) domains. (C) Bragg filtered image of (B) obtained by placing a mask in the Fourier transform (). (D) Squared modulus of a Fourier transform of the sample transmission function (B) multiplied by a Gaussian mask (0.5-μm wide) centered in the lowest indicated dislocation in (B). (E) Reconstructed phases. Average along the vertical is shown together with the color bar on the bottom. Scale bars, 2 μm (A to C and E).