Literature DB >> 27376468

Indium-Free Fully Transparent Electronics Deposited Entirely by Atomic Layer Deposition.

Pradipta K Nayak1, Zhenwei Wang1, Husam N Alshareef2.   

Abstract

Indium-free, fully transparent thin-film transistors are fabricated entirely by the atomic layer deposition technique on rigid and flexible substrates at a low temperature of 160 °C. The transistors show high saturation mobility, large switching ratio, and small subthreshold swing value. The inverters and ring oscillators show large gain value and small propagation delay time, indicating the potential of this process in transparent electronic devices.
© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Entities:  

Keywords:  atomic layer deposition; fully transparent; thin-film transistors; zinc oxide

Year:  2016        PMID: 27376468     DOI: 10.1002/adma.201600503

Source DB:  PubMed          Journal:  Adv Mater        ISSN: 0935-9648            Impact factor:   30.849


  3 in total

Review 1.  Atomic Layer Deposition of Metal Oxides and Chalcogenides for High Performance Transistors.

Authors:  Chengxu Shen; Zhigang Yin; Fionn Collins; Nicola Pinna
Journal:  Adv Sci (Weinh)       Date:  2022-06-16       Impact factor: 17.521

2.  Bi-layer Channel AZO/ZnO Thin Film Transistors Fabricated by Atomic Layer Deposition Technique.

Authors:  Huijin Li; Dedong Han; Liqiao Liu; Junchen Dong; Guodong Cui; Shengdong Zhang; Xing Zhang; Yi Wang
Journal:  Nanoscale Res Lett       Date:  2017-03-24       Impact factor: 4.703

3.  Reliability enhancement in thin film transistors using Hf and Al co-incorporated ZnO active channels deposited by atomic-layer-deposition.

Authors:  So-Yeong Na; Sung-Min Yoon
Journal:  RSC Adv       Date:  2018-10-05       Impact factor: 3.361

  3 in total

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