| Literature DB >> 27366634 |
Milenko Markovic1, Bruce O Fowler2, Ming S Tung1.
Abstract
Numerous biological and chemical studies involve the use of calcium hydroxyapatite (HA), Ca10(PO4)6(OH)2. In this study detailed physicochemical characterization of HA, prepared from an aqueous solution, was carried out employing different methods and techniques: chemical and thermal analyses, x-ray diffraction, infrared and Raman spectroscopies, scanning and transmission microscopies, and Brunauer, Emmett, and Teller (BET) surface-area method. The contents of calcium (Ca(2+)), phosphate (PO4 (3-)), hydroxide (OH(-)), hydrogenphosphate (HPO4 (2-)), water (H2O), carbonate (CO3 (2-)), and trace constituents, the Ca/P molar ratio, crystal size and morphology, surface area, unit-cell parameters, crystallinity, and solubility of this HA were determined. This highly pure, homogeneous, and highly crystalline HA is certified as a National Institute of Standards and Technology (NIST) standard reference material, SRM 2910.Entities:
Keywords: Raman; chemical analysis; crystal size; crystallinity; hydroxyapatite; infrared; morphology; preparation; solubility; surface area; thermal analysis; unit-cell parameters; x-ray diffraction
Year: 2004 PMID: 27366634 PMCID: PMC4856200 DOI: 10.6028/jres.109.042
Source DB: PubMed Journal: J Res Natl Inst Stand Technol ISSN: 1044-677X
Chemical composition of calcium hydroxyapatite standard reference material (HA-SRM) along with the calculated number and total relative charge of constituent ions per HA-SRM unit cella
| Constituent | Mass fraction (%) | Number of constituent ions/HA-SRM unit cell | Total relative charge of constituent ions/HA-SRM unit cell | |
|---|---|---|---|---|
| Ca2+ | 39.15 ± 0.10 | 20 | 9.985 ± 0.026 | +19.970 ± 0.051 |
| PO43− | 55.16 ± 0.15 | 20 | 5.937 ± 0.016 | −17.811 ± 0.048 |
| HPO42− | 0.592 ± 0.030 | 4 | 0.063 ± 0.003 | −0.126 ± 0.006 |
| H2O | 1.59 ± 0.05 | 5 | 0.902 ± 0.028 | 0 |
| CO32− | 0.032 ± 0.002 | 12 | 0.00545 ± 0.00034 | −0.0109 ± 0.0007 |
| SiO32− | 0.0406 | 1 | 0.00546 | −0.0109 |
| Trace elements | 0.0181 | 1 | 0.00595 | +0.0144 |
| OH− | 3.37 | 2.026 | −2.026 | |
|
| ||||
| Sum | 99.95 ± 0.22 0 | 0 | ||
All results expressed as mean value ±U, where U is expanded uncertainty.
Number of replicate measurements.
Number of constituent ions normalized to six phosphate groups (5.937 PO4 + 0.063 HPO4).
Calculated from relative electrical charge of the constituent ion time number of the constituent ions.
Calculated from silicon content in Table 2.
From Table 2.
Calculated to balance total charge to 0.
Derived from calculated relative charge of −2.026g.
Fig. 1TG-curve for HA-SRM in the temperature range from 30 °C to 900 °C in a nitrogen atmosphere. The left ordinate denotes the mass fraction and the right ordinate gives the corresponding calculated number of water layers progressively removed from the HA-SRM surface.
Contents of trace constituentsa and silicon in HA-SRM
| Trace constituent | Mass fraction (%) | Number of ions/HA-SRM unit cell |
|---|---|---|
| Al3+ | 0.0029 | 0.00110 |
| Ba2+ | 0.0024 | 0.00018 |
| B3+ | 0.0015 | 0.00142 |
| Mg2+ | 0.0029 | 0.00122 |
| Na+ | 0.0031 | 0.00138 |
| Sr2+ | 0.0044 | 0.00051 |
| Zn2+ | 0.0009 | 0.00014 |
|
| ||
| Sum | 0.0181 | 0.00595 |
|
| ||
| Si | 0.0150 | 0.00546 |
Trace constituents having mass fraction >0.0005 % are included.
Calculated number of ions per unit-cell.
Fig. 2Transmission electron micrograph (top) and scanning electron micrograph (bottom) of the HA-SRM crystals. Both micro-graphs have the same magnification and the bar length in the top micrograph is 0.5 μm.
Fig. 3Infrared percent transmittance spectra of HA-SRM from concentrations of 0.8 mg and 4.0 mg of HA-SRM/400 mg of KBr in the 4000 cm−1 to 300 cm−1 region. BL denotes the KBr pellet baseline.
Fig. 4Infrared absorbance spectrum of the ν3 PO4 mode of HA-SRM (dashed line) and second derivative of the absorbance spectrum (solid line). The second derivative spectrum ordinate scale, not shown, is arbitrary. The second derivative spectrum was adjusted to full ordinate range and the minima denoted by numbers identify band positions in the absorbance spectrum.
Fig. 5Infrared absorbance spectrum of the ν4 PO4 mode of HA-SRM (dashed line) and second derivative of the absorbance spectrum (solid line). The absorbance band at 633 cm−1 and second derivative band at 633 cm−1 derive from the OH− librational mode. The description of the second derivative spectrum is the same as that given in Fig. 4.
IR wavenumber positions of ν3 and ν4 PO4 bands of HA-SRM obtained from second derivative spectra
| PO4 bands (cm−1) | ||
|---|---|---|
| Band number | ||
| 1 | 1027.0 | 565.1 |
| 2 | 1033.7 | 575.3 |
| 3 | 1036.0 | 586.4 |
| 4 | 1038.7 | 601.8 |
| 5 | 1043.6 | 605.4 |
| 6 | ||
| 7 | 1054.0 | |
| 8 | 1065.4 | |
| 9 | 1073.9 | |
| 10 | 1081.3 | |
| 11 | 1087.7 | |
| 12 | 1097.5 | |
Refer to Figs. 4 and 5.
These two bands are attributed to arise from monoclinic HA (mass fraction ≈25 %).
Fig. 6Raman spectra of HA-SRM from 4000 cm−1 to 50 cm−1 recorded at relative intensities of 1 and 10 below 1200 cm−1 and 3.3 above 1200 cm−1. BL denotes the baseline.
Predicted number and coincidence or noncoincidence of infrared and Raman ν1, ν2, ν3, and ν4 bands for PO4 modes of hexagonal structures (P63/m, C6h) and (P63, C6) of calcium hydroxyapatitea and observed bands for HA-SRM
| Hexagonal structure | Spectra | PO4 modes | |||
|---|---|---|---|---|---|
| P63/m, C6h | IR predicted | 1nc | 2nc | 3nc | 3nc |
| R predicted | 2nc | 3nc | 5nc | 5nc | |
| P63, C6 | IR predicted | 2c | 4c | 6c | 6c |
| R predicted | 1nc, 2c | 2nc, 4c | 3nc, 6c | 3nc, 6c | |
| HA-SRM | IR observed | 1c | 2nc | 7nc, 2c | 4nc, 1c |
| R observed | 1c | 2nc | 3nc, 2c | 3nc, 1c | |
Predicted from Ref. 21.
IR = infrared.
R = Raman.
c = coincident.
nc = noncoincident.
Fig. 7X-ray diffraction pattern of HA-SRM in the 2θ range from 3° to 70°.
2θ-values and relative intensities (Irel) observed from the XRD pattern of HA-SRM, d-values determined from 2θ-values (d2), d-values calculated from unit cell parameters (dcalc), and corresponding indices (hkl)
| 2 | ||||
|---|---|---|---|---|
| 10.85 | 0.815 | 0.816 | 8 | 100 |
| 16.87 | 0.525 | 0.526 | 3 | 101 |
| 18.84 | 0.471 | 0.471 | 2 | 110 |
| 21.75 | 0.408 | 0.408 | 6 | 200 |
| 22.84 | 0.389 | 0.389 | 6 | 111 |
| 25.35 | 0.351 | 0.351 | 2 | 201 |
| 25.86 | 0.344 | 0.344 | 36 | 002 |
| 28.11 | 0.317 | 0.317 | 8 | 102 |
| 28.92 | 0.308 | 0.308 | 16 | 210 |
| 31.77 | 0.281 | 0.281 | 100 | 211 |
| 32.18 | 0.278 | 0.278 | 47 | 112 |
| 32.90 | 0.272 | 0.272 | 65 | 300 |
| 34.04 | 0.263 | 0.263 | 22 | 202 |
| 35.44 | 0.253 | 0.253 | 5 | 301 |
| 39.18 | 0.2297 | 0.2297 | 6 | 212 |
| 39.793 | 0.2263 | 0.2263 | 22 | 310 |
| 40.43 | 0.2229 | 0.2229 | 1 | 221 |
| 41.98 | 0.2150 | 0.2150 | 6 | 311 |
| 42.30 | 0.2135 | 0.2134 | 1 | 302 |
| 43.84 | 0.2063 | 0.2063 | 4 | 113 |
| 44.36 | 0.2040 | 0.2040 | 1 | 400 |
| 45.29 | 0.2000 | 0.2000 | 4 | 203 |
| 46.683 | 0.1944 | 0.1944 | 28 | 222 |
| 48.068 | 0.1891 | 0.1891 | 12 | 312 |
| 48.58 | 0.1872 | 0.1872 | 3 | 320 |
| 49.458 | 0.1841 | 0.1841 | 30 | 213 |
| 50.474 | 0.1807 | 0.1807 | 15 | 321 |
| 51.254 | 0.1781 | 0.1781 | 11 | 410 |
| 52.061 | 0.1755 | 0.1755 | 11 | 402 |
| 53.167 | 0.1721 | 0.1721 | 14 | 004 |
| 54.43 | 0.1684 | 0.1684 | 1 | 104 |
| 55.85 | 0.1645 | 0.1645 | 6 | 322 |
| 57.11 | 0.1611 | 0.1611 | 4 | 313 |
| 58.03 | 0.1588 | 0.1588 | 2 | 501 |
| 58.28 | 0.1582 | 0.1582 | 2 | 412 |
| 58.74 | 0.1570 | 0.1570 | 1 | 330 |
| 59.93 | 0.1542 | 0.1542 | 4 | 420 |
2θ-values have expanded uncertainty (U) of ±0.004° 2θ (n = 4).
Unit-cell parameters for HA-SRM and similarly prepared HA by McDowell et al. [9]
| Sample | XRD analysis | Reference | ||
|---|---|---|---|---|
| HA-SRM | 0.94238 ± 0.00009 | 0.68854 ± 0.00006 | Standard | This paper |
| HA-SRM | 0.942253 ± 0.000013 | 0.688501 ± 0.000009 | Rietveld | [ |
| HA-SRM | 0.94244 ± 0.00002 | 0.68854 ± 0.00002 | Rietveld | [ |
| HA-McDowell | 0.94174 ± 0.00002 | 0.68853 ± 0.00002 | Rietveld | [ |
Mean value ± expanded uncertainty (U).
Mean value ± standard deviation.
The line width at half-height (B-value) for selected XRD lines of HA-SRM, the corresponding line width at half-height (b-value) of hc-HAa, and calculated 1/β values
| b(° 2 | 1/ | ||
|---|---|---|---|
| 200 | 0.225 ± 0.007 | 0.150 ± 0.002 | 6.0 ± 0.3 |
| 002 | 0.188 ± 0.002 | 0.145 ± 0.002 | 8.4 ± 0.2 |
| 102 | 0.183 ± 0.005 | 0.136 ± 0.004 | 8.2 ± 0.4 |
| 210 | 0.218 ± 0.003 | 0.134 ± 0.003 | 5.8 ± 0.2 |
| 310 | 0.218 ± 0.004 | 0.120 ± 0.004 | 5.5 ± 0.2 |
| 004 | 0.181 ± 0.005 | 0.114 ± 0.003 | 7.1 ± 0.3 |
Highly crystalline HA prepared by solid state thermal reaction [17].