| Literature DB >> 27322601 |
Vasudevan Kannan1, Akbar I Inamdar2, Sambaji M Pawar2, Hyun-Seok Kim3, Hyun-Chang Park3, Hyungsang Kim2, Hyunsik Im2, Yeon Sik Chae4.
Abstract
We report an efficient method for growing NiO nanostructures by oblique angle deposition (OAD) technique in an e-beam evaporator for supercapacitor applications. This facile physical vapor deposition technique combined with OAD presents a unique, direct, and economical route for obtaining high width-to-height ratio nanorods for supercapacitor electrodes. The NiO nanostructure essentially consists of nanorods with varying dimensions. The sample deposited at OAD 75° showed highest supercapacitance value of 344 F/g. NiO nanorod electrodes exhibits excellent electrochemical stability with no degradation in capacitance after 5000 charge-discharge cycles. The nanostructured film adhered well to the substrate and had 131% capacity retention. Peak energy density and power density of the NiO nanorods were 8.78 Wh/kg and 2.5 kW/kg, respectively. This technique has potential to be expanded for growing nanostructured films of other interesting metal/metal oxide candidates for supercapacitor applications.Entities:
Keywords: NiO; e-beam evaporation; electrochemical supercapacitor; nanostructures; oblique angle deposition
Year: 2016 PMID: 27322601 DOI: 10.1021/acsami.6b03714
Source DB: PubMed Journal: ACS Appl Mater Interfaces ISSN: 1944-8244 Impact factor: 9.229