| Literature DB >> 27250368 |
Takahisa Koyama1, Hirokatsu Yumoto1, Takanori Miura1, Kensuke Tono1, Tadashi Togashi1, Yuichi Inubushi1, Tetsuo Katayama1, Jangwoo Kim2, Satoshi Matsuyama2, Makina Yabashi1, Kazuto Yamauchi2, Haruhiko Ohashi1.
Abstract
We evaluated the damage threshold of coating materials such as Mo, Ru, Rh, W, and Pt on Si substrates, and that of uncoated Si substrate, for mirror optics of X-ray free electron lasers (XFELs). Focused 1 μm (full width at half maximum) XFEL pulses with the energies of 5.5 and 10 keV, generated by the SPring-8 angstrom compact free electron laser (SACLA), were irradiated under the grazing incidence condition. The damage thresholds were evaluated by in situ measurements of X-ray reflectivity degradation during irradiation by multiple pulses. The measured damage fluences below the critical angles were sufficiently high compared with the unfocused SACLA beam fluence. Rh coating was adopted for two mirror systems of SACLA. One system was a beamline transport mirror system that was partially coated with Rh for optional utilization of a pink beam in the photon energy range of more than 20 keV. The other was an improved version of the 1 μm focusing mirror system, and no damage was observed after one year of operation.Entities:
Year: 2016 PMID: 27250368 DOI: 10.1063/1.4950723
Source DB: PubMed Journal: Rev Sci Instrum ISSN: 0034-6748 Impact factor: 1.523