| Literature DB >> 27195446 |
D G Kotsifaki1, M Kandyla1, P G Lagoudakis2.
Abstract
Plasmonic optical tweezers are a ubiquitous tool for the precise manipulation of nanoparticles and biomoleEntities:
Year: 2016 PMID: 27195446 PMCID: PMC4872531 DOI: 10.1038/srep26275
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Experimental design.
(a) Scanning electron microscope (SEM) image, at side (45o) view of the surface, of an uncoated femtosecond-laser nanostructured silicon substrate. Inset: magnified view of a femtosecond-laser nanostructured silicon substrate after coating with 3 nm of copper and 50 nm of gold. (b) Schematic diagram of the optical trapping setup.
Figure 2Trapping efficiency measurements versus separation distance.
(a) Trapping efficiency, Q, as a function of the relative distance, z, between the trapping laser beam focus and various substrates. Relative distance is the measured distance with respect to the zero position. Solid line: exponential fit to the data obtained with the nanostructured silicon substrate, coated with Cu/Au. Trapping data were obtained with the CW laser setup. (b) Trapping efficiency, Q, as a function of the relative distance, z, between the trapping laser beam focus and the nanostructured silicon substrate, coated with Cu/Au, obtained with three different laser systems for the same wavelength (1070 nm). The laser systems are: CW laser at 1070 nm; femtosecond laser at 1070 nm (140 fs); optical parametric oscillator (OPO) at 1070 nm (200 fs). The x-error corresponds to the Rayleigh length of the trapping laser beam and the y-error to the standard deviation of the trapping efficiency measurement.
Figure 3Wavelength–dependent characterization of trapping efficiency.
Trapping efficiency, Q, as a function of the trapping laser wavelength, measured at distances (a) z = 1 μm, (b) z = 4 μm, (c) z = 6 μm, (d) z = 8 μm, and (e) z = 10 μm above the nanostructured silicon substrate, coated with Cu/Au. Solid lines: Gaussian fit to the data. Trapping data were obtained with the femtosecond laser setup. The y-error corresponds to the standard deviation of the trapping efficiency measurement. (f) Maximum trapping efficiency, Qmax, resulting from the fits presented in Fig. 3a–e, as a function of the relative distance, z, between the trapping laser beam focus and the substrate. Relative distance is the measured distance with respect to the zero position. Solid line: exponential fit to the data. The y-error corresponds to the error of the Gaussian fit.
Figure 4Surface plot of the trapping efficiency, Q, as a function of the relative distance, z, between the trapping laser beam focus and the Cu/Au-coated nanostructured silicon substrate and as a function of the trapping wavelength, obtained with the femtosecond laser setup.
Relative distance is the measured distance with respect to the zero position. The experimental trapping efficiency values are interpolated on a color map surface. The colored bar indicates the minimum and maximum interpolated trapping efficiency values.