| Literature DB >> 27096128 |
Michael Forbes1, Jim Lawrence1, Yu Lei2, Raghu N Kacker1, D Richard Kuhn1.
Abstract
Covering arrays are structures for well-representing extremely large input spaces and are used to efficiently implement blackbox testing for software and hardware. This paper proposes refinements over the In-Parameter-Order strategy (for arbitrary t). When constructing homogeneous-alphabet covering arrays, these refinements reduce runtime in nearly all cases by a factor of more than 5 and in some cases by factors as large as 280. This trend is increasing with the number of columns in the covering array. Moreover, the resulting covering arrays are about 5 % smaller. Consequently, this new algorithm has constructed many covering arrays that are the smallest in the literature. A heuristic variant of the algorithm sometimes produces comparably sized covering arrays while running significantly faster.Entities:
Keywords: blackbox testing; covering arrays; pairwise and higher strength testing
Year: 2008 PMID: 27096128 PMCID: PMC4652878 DOI: 10.6028/jres.113.022
Source DB: PubMed Journal: J Res Natl Inst Stand Technol ISSN: 1044-677X
Horizontal Growth
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Vertical Growth
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Fig. 3Size comparisons for t = 3, v = 3.
Fig. 6Size comparisons for t = 6, v = 2.
Heuristic Horizontal Growth
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Fig. 1Execution time for t = 3, v = 3.
Fig. 2Time comparisons for t = 3, v = 3.
Fig. 4Execution time for t = 6, v = 2.
Fig. 5Time comparisons for t = 6, v = 2.
Fig. 7Covering array numbers for t = 4, v = 3.