Literature DB >> 27074908

High-Performance, Solution-Processed, Embedded Multiscale Metallic Transparent Conductors.

Yong Suk Oh1, Hyunwoo Lee2, Dong Yun Choi1, Sung-Uk Lee1, Hojin Kim3, Seunghyup Yoo2, Inkyu Park1, Hyung Jin Sung1.   

Abstract

High-performance multiscale metallic transparent conductors (TCs) are demonstrated by incorporating Ag nanowire (NW) networks into microscale Ag grid structures. Highly conductive Ag grids are fabricated via direct imprinting of an Ag ion ink using a reservoir-assisted mold. In this mold, a macroscale cavity, called the "reservoir", is designed to connect to a grid-patterned cavity. The reservoir has a large cavity volume, which reduces unwanted residual layers within the grid spacings by introducing a thinner liquid film. The reservoir undergoes a large volume reduction during mold deformation, which improves ink filling within the grid-patterned cavity through deformation-induced ink injection. The multiscale metallic TCs show a sheet resistance (Rs) of <1.5 Ω/sq and a transmittance (T) of 86% at 550 nm, superior to the corresponding values of Ag NW networks (Rs of 15.6 Ω/sq at a similar T). We estimate the Rs-T performances of the Ag grids using geometrical calculations and demonstrate that their integration can enhance the opto-electrical properties of the Ag NW networks. Multiscale metallic TCs are successfully transferred and embedded into a transparent, flexible, and UV-curable polymer matrix. The embedded multiscale metallic TCs show reasonable electromechanical and chemical stability. The utility of these TCs is demonstrated by fabricating flexible organic solar cells.

Entities:  

Keywords:  direct imprinting; embedding; metal grid; silver nanowire; transparent conductor

Year:  2016        PMID: 27074908     DOI: 10.1021/acsami.6b02333

Source DB:  PubMed          Journal:  ACS Appl Mater Interfaces        ISSN: 1944-8244            Impact factor:   9.229


  1 in total

1.  Temperature-Controlled Direct Imprinting of Ag Ionic Ink: Flexible Metal Grid Transparent Conductors with Enhanced Electromechanical Durability.

Authors:  Yong Suk Oh; Hyesun Choi; Jaeho Lee; Hyunwoo Lee; Dong Yun Choi; Sung-Uk Lee; Kyeong-Soo Yun; Seunghyup Yoo; Taek-Soo Kim; Inkyu Park; Hyung Jin Sung
Journal:  Sci Rep       Date:  2017-09-11       Impact factor: 4.379

  1 in total

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