| Literature DB >> 27074130 |
Yiqin Chen1, Quan Xiang1, Zhiqin Li1, Yasi Wang1, Yuhan Meng1, Huigao Duan1.
Abstract
We report a unique lithographic process, termed "Sketch and Peel" lithography (SPL), for fast, clean, and reliable patterning of metallic structures from tens of nanometers to submillimeter scale using direct writing technology. The key idea of SPL process is to define structures using their presketched outlines as the templates for subsequent selective peeling of evaporated metallic layer. With reduced exposure area, SPL process enables significantly improved patterning efficiency up to hundreds of times higher and greatly mitigated proximity effect compared to current direct writing strategy. We demonstrate that multiscale hierarchical metallic structures with arbitrary shapes and minimal feature size of ∼15 nm could be defined with high fidelity using SPL process for potential nanoelectronic and nano-optical applications.Keywords: Multiscale patterning; electron-beam lithography; nanogaps; plasmonics; selective peeling
Year: 2016 PMID: 27074130 DOI: 10.1021/acs.nanolett.6b00788
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189