| Literature DB >> 27071341 |
A Higginbotham1, P G Stubley1, A J Comley2, J H Eggert3, J M Foster2, D H Kalantar3, D McGonegle1, S Patel1, L J Peacock2, S D Rothman2, R F Smith3, M J Suggit1, J S Wark1.
Abstract
The elastic and inelastic response of [001] oriented silicon to laser compression has been a topic of considerable discussion for well over a decade, yet there has been little progress in understanding the basic behaviour of this apparently simple material. We present experimental x-ray diffraction data showing complex elastic strain profiles in laser compressed samples on nanosecond timescales. We also present molecular dynamics and elasticity code modelling which suggests that a pressure induced phase transition is the cause of the previously reported 'anomalous' elastic waves. Moreover, this interpretation allows for measurement of the kinetic timescales for transition. This model is also discussed in the wider context of reported deformation of silicon to rapid compression in the literature.Entities:
Year: 2016 PMID: 27071341 PMCID: PMC4829838 DOI: 10.1038/srep24211
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1(a,b) Schematic of the experimental geometry from two angles. In both cases the base plate (which supports the sample) is omitted for clarity. The dashed box in (b) highlights a representative Laue peak, expanded in (c), showing the splitting of the feature consistent with the existence of one tensile, and two compressive strains.
Figure 2Density profiles for elasticity code (solid black) and MD (dashed red) for a 32 GPa shock in a 0.3 μm sample.
For reference, snapshots of the MD coded by the F33 (upper) and F11 (lower) per atom deformation gradient components are included. Shown inset (top right) is a elasticity based simulation showing the evolution of this profile out to a 300 μm sample, where the distinct high strain plateau is absent.
Figure 3Elasticity code determined strain history the sample (a) after onset of the drive within the silicon. Shown inset in (b) are simulated and experimental white light Laue signals for x-ray exposure between 3.5–4.5 ns (as indicated by the dashed lines) in (a). This is consistent with the experimental backligher timing of 5 ns once transit time though the ablator is accounted for. Also shown in (b) are lineouts of these signals.