Literature DB >> 27070050

Direct Atom Imaging by Chemical-Sensitive Holography.

Tobias Lühr1, Aimo Winkelmann2, Gert Nolze3, Dominique Krull1, Carsten Westphal1.   

Abstract

In order to understand the physical and chemical properties of advanced materials, functional molecular adsorbates, and protein structures, a detailed knowledge of the atomic arrangement is essential. Up to now, if subsurface structures are under investigation, only indirect methods revealed reliable results of the atoms' spatial arrangement. An alternative and direct method is three-dimensional imaging by means of holography. Holography was in fact proposed for electron waves, because of the electrons' short wavelength at easily accessible energies. Further, electron waves are ideal structure probes on an atomic length scale, because electrons have a high scattering probability even for light elements. However, holographic reconstructions of electron diffraction patterns have in the past contained severe image artifacts and were limited to at most a few tens of atoms. Here, we present a general reconstruction algorithm that leads to high-quality atomic images showing thousands of atoms. Additionally, we show that different elements can be identified by electron holography for the example of FeS2.

Entities:  

Keywords:  Holography; atomic imaging; electron backscattering; electron diffraction; photoemission

Year:  2016        PMID: 27070050     DOI: 10.1021/acs.nanolett.6b00524

Source DB:  PubMed          Journal:  Nano Lett        ISSN: 1530-6984            Impact factor:   11.189


  2 in total

1.  Photoelectron Holographic Atomic Arrangement Imaging of Cleaved Bimetal-intercalated Graphite Superconductor Surface.

Authors:  Fumihiko Matsui; Ritsuko Eguchi; Saki Nishiyama; Masanari Izumi; Eri Uesugi; Hidenori Goto; Tomohiro Matsushita; Kenji Sugita; Hiroshi Daimon; Yuji Hamamoto; Ikutaro Hamada; Yoshitada Morikawa; Yoshihiro Kubozono
Journal:  Sci Rep       Date:  2016-11-04       Impact factor: 4.379

2.  Manual measurement of angles in backscattered and transmission Kikuchi diffraction patterns.

Authors:  Gert Nolze; Tomasz Tokarski; Grzegorz Cios; Aimo Winkelmann
Journal:  J Appl Crystallogr       Date:  2020-03-25       Impact factor: 3.304

  2 in total

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