Literature DB >> 27036767

A high-resolution time-of-flight energy analyzer for femtosecond electron pulses at 30 keV.

Alexander Gliserin1, Matthew Walbran1, Peter Baum1.   

Abstract

We report a time-of-flight spectrometer for electron pulses at up to 30 keV, which is a suitable energy for atomic-resolution femtosecond investigations via time-resolved electron diffraction, microscopy, and energy loss spectroscopy. For realistic femtosecond beams without apertures, the instrument's energy resolution is ∼0.5 eV (full width at half maximum) or 2 × 10(-5) at a throughput of 50%-90%. We demonstrate the analyzer's versatility by three first applications, namely, femtosecond electron pulse metrology via optical streaking, in situ drift correction in laser-microwave synchronization for electron pulse compression, and time-resolved electron energy loss spectroscopy of aluminum, showing the instrument's capability of tracking plasmonic loss peak positions with few-meV accuracy.

Entities:  

Year:  2016        PMID: 27036767     DOI: 10.1063/1.4942912

Source DB:  PubMed          Journal:  Rev Sci Instrum        ISSN: 0034-6748            Impact factor:   1.523


  3 in total

1.  Time-of-flight electron energy loss spectroscopy using TM110 deflection cavities.

Authors:  W Verhoeven; J F M van Rens; M A W van Ninhuijs; W F Toonen; E R Kieft; P H A Mutsaers; O J Luiten
Journal:  Struct Dyn       Date:  2016-09-13       Impact factor: 2.920

2.  Time-of-flight electron energy loss spectroscopy by longitudinal phase space manipulation with microwave cavities.

Authors:  W Verhoeven; J F M van Rens; W F Toonen; E R Kieft; P H A Mutsaers; O J Luiten
Journal:  Struct Dyn       Date:  2018-10-12       Impact factor: 2.920

3.  Electron energy analysis by phase-space shaping with THz field cycles.

Authors:  Dominik Ehberger; Catherine Kealhofer; Peter Baum
Journal:  Struct Dyn       Date:  2018-08-29       Impact factor: 2.920

  3 in total

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