Literature DB >> 26958446

The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference Materials.

James P Cline1, Marcus H Mendenhall1, David Black1, Donald Windover1, Albert Henins1.   

Abstract

The laboratory X-ray powder diffractometer is one of the primary analytical tools in materials science. It is applicable to nearly any crystalline material, and with advanced data analysis methods, it can provide a wealth of information concerning sample character. Data from these machines, however, are beset by a complex aberration function that can be addressed through calibration with the use of NIST Standard Reference Materials (SRMs). Laboratory diffractometers can be set up in a range of optical geometries; considered herein are those of Bragg-Brentano divergent beam configuration using both incident and diffracted beam monochromators. We review the origin of the various aberrations affecting instruments of this geometry and the methods developed at NIST to align these machines in a first principles context. Data analysis methods are considered as being in two distinct categories: those that use empirical methods to parameterize the nature of the data for subsequent analysis, and those that use model functions to link the observation directly to a specific aspect of the experiment. We consider a multifaceted approach to instrument calibration using both the empirical and model based data analysis methods. The particular benefits of the fundamental parameters approach are reviewed.

Entities:  

Keywords:  Rietveld analysis; Standard Reference Material; X-ray powder diffraction; calibration; fundamental parameters approach; instrument alignment; lattice parameters; profile fitting

Year:  2015        PMID: 26958446      PMCID: PMC4730681          DOI: 10.6028/jres.120.013

Source DB:  PubMed          Journal:  J Res Natl Inst Stand Technol        ISSN: 1044-677X


  2 in total

1.  X-ray K alpha satellites of copper.

Authors: 
Journal:  Phys Rev A Gen Phys       Date:  1988-10-01

2.  Addressing the amorphous content issue in quantitative phase analysis: the certification of NIST standard reference material 676a.

Authors:  James P Cline; Robert B Von Dreele; Ryan Winburn; Peter W Stephens; James J Filliben
Journal:  Acta Crystallogr A       Date:  2011-06-17       Impact factor: 2.290

  2 in total
  2 in total

1.  The optics of focusing bent-crystal monochromators on X-ray powder diffractometers with application to lattice parameter determination and microstructure analysis.

Authors:  Marcus H Mendenhall; David Black; James P Cline
Journal:  J Appl Crystallogr       Date:  2019       Impact factor: 3.304

2.  Fluorescent Porous Silica Microspheres for Highly and Selectively Detecting Hg2+ and Pb2+ Ions and Imaging in Living Cells.

Authors:  Wei Sun; Qi Sun; Qiang Zhao; Luminita Marin; Xinjian Cheng
Journal:  ACS Omega       Date:  2019-10-24
  2 in total

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