| Literature DB >> 26948248 |
Sung-Kuk Bae1, Beomjoon Choi2, Haseung Chung1,2, Seungwon Shin1,2, Hee-eun Song3, Jung Hwan Seo1,2,4.
Abstract
This article presents a novel technique to estimate the mechanical properties of the aluminum composite layer on silicon solar cells by using a hybrid 3-dimensional laser scanning force measurement (3-D LSFM) system. The 3-D LSFM system measures the material properties of sub-layers constituting a solar cell. This measurement is critical for realizing high-efficient ultra-thin solar cells. The screen-printed aluminum layer, which significantly affects the bowing phenomenon, is separated from the complete solar cell by removing the silicon (Si) layer with deep reactive ion etching. An elastic modulus of ~15.1 GPa and a yield strength of ~35.0 MPa for the aluminum (Al) composite layer were obtained by the 3-D LSFM system. In experiments performed for 6-inch Si solar cells, the bowing distances decreased from 12.02 to 1.18 mm while the Si layer thicknesses increased from 90 to 190 μm. These results are in excellent agreement with the theoretical predictions for ultra-thin Si thickness (90 μm) based on the obtained Al composite layer properties.Entities:
Year: 2016 PMID: 26948248 PMCID: PMC4780100 DOI: 10.1038/srep22752
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Conceptual illustrations of (a) solar cell fabrication and (b) micro-fabrication process of the sintered Al layer sample.
Figure 2(a) Conceptual diagram of 3-D LSFM system. The 3-D LSFM system consists of a 3-D laser scanner, a push-gauge, and a push-gauge holder. (b) Schematic of the 3-D laser scanner incorporated into the 3-D LSFM system showing its working principle.
Figure 3(a) Exploded view conceptual diagram of a nano-indenter. (b) Image of the nano-indenter used to measure the elastic modulus and the yield stress of the Al membrane. (c) Diagram illustrating the concept of the nano-indentation method to estimate the mechanical properties of the Al layer.
Figure 4Plots of the elastic modulus of the Al layer measured by (a) the 3-D LSFM system and (b) the nano-indenter.
Figure 5(a) Scanned 3-D surface configuration of the Al layer at a pushing load of 0.74 N just before plastic deformation occurs. (b) Finite element simulation of the Al layer deformation for the corresponding load condition. (c) Modeled (red line) and experimental (blue line) surface displacement under a pushing load of 0.74 N by the 3-D LSFM system. (d) SEM image of the cross-sectional Al layer, which is capable of measuring the material porosity. (e) Plot of yield stress for the etched (red) and non-etched (green) faces using the nano-indenter. The 3-D LSFM test result is also plotted as a yellow area for comparison.
Figure 6Modeled (3 lines (red, black, blue)) and experimental (circles) values of bowing distance versus the silicon substrate thickness of a Si solar cell.