| Literature DB >> 26919321 |
Sang Wook Jung1,2, Soo Sang Chae1, Jee Ho Park1, Jin Young Oh1, Suk Ho Bhang3, Hong Koo Baik1, Tae Il Lee4.
Abstract
We introduce a microscale soft pattering (MSP) route utilizing contact printing of chemically inert sub-nanometer thick low molecular weight (LMW) poly(dimethylsiloxane) (PDMS) layers. These PDMS layers serve as a release agent layer between the n-type Ohmic metal and metal oxide semiconductors (MOSs) and provide a layer that protects the MOS from water in the surrounding environment. The feasibility of our MSP route was experimentally demonstrated by fabricating solution processable In2O3, IZO, and IGZO TFTs with aluminum (Al), a typical n-type Ohmic metal. We have demonstrated patterning gaps as small as 13 μm. The TFTs fabricated using MSP showed higher field-effect-mobility and lower hysteresis in comparison with those made using conventional photolithography.Entities:
Keywords: contact printing; metal oxide semiconductor; metal patterning; soft-lithography; thin film transistor
Year: 2016 PMID: 26919321 DOI: 10.1021/acsami.5b10847
Source DB: PubMed Journal: ACS Appl Mater Interfaces ISSN: 1944-8244 Impact factor: 9.229