| Literature DB >> 26886870 |
Hyun Jeong1,2, Hye Min Oh1,3, Seungho Bang1,3, Hyeon Jun Jeong1,3, Sung-Jin An1,3, Gang Hee Han1, Hyun Kim1,3, Seok Joon Yun1,3, Ki Kang Kim4, Jin Cheol Park1,3, Young Hee Lee1,3, Gilles Lerondel2,3, Mun Seok Jeong1,3.
Abstract
We present a novel metal-insulator-semiconductor (MIS) diode consisting of graphene, hexagonal BN, and monolayer MoS2 for application in ultrathin nanoelectronics. The MIS heterojunction structure was fabricated by vertically stacking layered materials using a simple wet chemical transfer method. The stacking of each layer was confirmed by confocal scanning Raman spectroscopy and device performance was evaluated using current versus voltage (I-V) and photocurrent measurements. We clearly observed better current rectification and much higher current flow in the MIS diode than in the p-n junction and the metal-semiconductor diodes made of layered materials. The I-V characteristic curve of the MIS diode indicates that current flows mainly across interfaces as a result of carrier tunneling. Moreover, we observed considerably high photocurrent from the MIS diode under visible light illumination.Entities:
Keywords: Graphene; carrier tunneling; h-BN; metal−insulator−semiconductor diode; monolayer MoS2
Year: 2016 PMID: 26886870 DOI: 10.1021/acs.nanolett.5b04936
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189