| Literature DB >> 26866276 |
Ákos K Kiss1, Edgar F Rauch2, János L Lábár3.
Abstract
Correlation coefficient maps are constructed by computing the differences between neighboring diffraction patterns collected in a transmission electron microscope in scanning mode. The maps are shown to highlight material structural features like grain boundaries, second phase particles or dislocations. The inclination of the inner crystal interfaces are directly deduced from the resulting contrast.Keywords: Automated crystal orientation mapping (ACOM); Correlation coefficient map; Electron diffraction; Transmission electron microscopy (TEM)
Year: 2016 PMID： 26866276 DOI： 10.1016/j.ultramic.2016.01.006
Source DB: PubMed Journal: Ultramicroscopy ISSN： 0304-3991 Impact factor: 2.689