| Literature DB >> 26842791 |
E Zhitlukhina1, I Devyatov2,3, O Egorov4, M Belogolovskii5, P Seidel6.
Abstract
Quantitative description of charge transport across tunneling and break-junction devices with novel superconductors encounters some problems not present or not as severe for traditional superconducting materials. In this work, we explain unexpected features in related transport characteristics as an effect of a degraded nanoscaled sheath at the superconductor surface. A model capturing the main aspects of the ballistic charge transport across hybrid superconducting structures with normally conducting nanometer-thick interlayers is proposed. The calculations are based on a scattering formalism taking into account Andreev electron-into-hole (and inverse) reflections at normal metal-superconductor interfaces as well as transmission and backscattering events in insulating barriers between the electrodes. Current-voltage characteristics of such devices exhibit a rich diversity of anomalous (from the viewpoint of the standard theory) features, in particular shift of differential-conductance maxima at gap voltages to lower positions and appearance of well-defined dips instead expected coherence peaks. We compare our results with related experimental data.Entities:
Keywords: Anomalous features; Charge transport; Nanoscale degraded sheath; Superconducting heterostructures
Year: 2016 PMID: 26842791 PMCID: PMC4740478 DOI: 10.1186/s11671-016-1285-0
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Fig. 1Main panel: Differential conductance-versus-voltage characteristics for a planar three-dimensional N-I-n-S(s-wave) junction with various thicknesses of the normal n interlayer in the tunneling regime (D I << 1); parameters α = 2d n Δ /(ℏv F) and β = d n/l n. Inset: Effect of the electron mean free path on the conductance spectra of a tunneling N-I-n-S(s-wave) four-layered device; the three arrows show the main elements of the peak-dip-hump structure discussed in the text
Fig. 2Main panel: Effect of the barrier transparency on the peak-dip-hump structure in conductance spectra of a planar three-dimensional N-I-n-S(s-wave) junction; parameters α = 2d n Δ /(ℏv F) and β = d n/l n. Inset: Temperature effect on differential conductance-versus-voltage characteristics for a planar three-dimensional N-I-n-S structure with a high-transparency tunneling barrier (D I = 0.5)
Fig. 3Main panel: Differential conductance-versus-voltage characteristics for a planar three-dimensional N-I-n-S(d-wave) structure with different thicknesses of the normal n interlayer in the tunneling regime (D I << 1); the angle γ = 0; parameters α = 2d n Δ /(ℏv F) and β = d n/l n. Inset: Effect of the electron mean free path on the conductance spectra of the tunneling N-I-n-S(d-wave) structure
Fig. 4Main panel: Differential conductance-versus-voltage characteristics for a planar three-dimensional N-I-n-S(d-wave) structure with different thicknesses of the normal n interlayer in the tunneling regime (D I << 1); the angle γ = 45°; parameters α = 2d n Δ /(ℏv F) and β = d n/l n Inset: Effect of the electron mean free path on the conductance spectra of a tunneling N-I-n-S(d-wave) structure
Fig. 5Main panel: Current-voltage characteristics for a planar three-dimensional S-n-I-n-S junction with identical s-wave superconductors and various thicknesses of the normal n interlayer in the tunneling regime (D I << 1). Inset: Conductance spectra of the S-n-I-n-S device, α = 1
Fig. 6Differential conductance-versus-voltage spectra for a planar S-n-I-n-S junction with identical s-wave superconductors and high-transparency transition region (D I = 0.7) without n interlayer (α = 0) and for a finite thickness of the normal n interlayer. Shaded regions show positions of the 2Δ/n features (peaks in the first case and dips in the second case) in the conductance spectra