| Literature DB >> 26832311 |
O Sobol1, F Straub1, Th Wirth1, G Holzlechner1, Th Boellinghaus1, W E S Unger1.
Abstract
For more than one century, hydrogen assisted degradation of metallic microstructures has been identified as origin for severe technical component failures but the mechanisms behind have not yet been completely understood so far. Any in-situ observation of hydrogen transport phenomena in microstructures will provide more details for further elucidation of these degradation mechanisms. A novel experiment is presented which is designed to elucidate the permeation behaviour of deuterium in a microstructure of duplex stainless steel (DSS). A hydrogen permeation cell within a TOF-SIMS instrument enables electrochemical charging with deuterium through the inner surface of the cell made from DSS. The outer surface of the DSS permeation cell exposed to the vacuum has been imaged by TOF-SIMS vs. increasing time of charging with subsequent chemometric treatment of image data. This in-situ experiment showed evidently that deuterium is permeating much faster through the ferrite phase than through the austenite phase. Moreover, a direct proof for deuterium enrichment at the austenite-ferrite interface has been found.Entities:
Year: 2016 PMID: 26832311 PMCID: PMC4735803 DOI: 10.1038/srep19929
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Schematic view of the unique design of the real time and in-situ deuterium permeation experiment within ultra-high vacuum chamber of the ToF-SIMS instrument.
This set-up enables to monitor the deuterium distribution in the DSS microstructure at the polished vacuum exposed surface of the charging cell made from 2205 DSS. Deuterium becomes visible after permeation through a 0.5 mm thick DSS sheet.
Figure 2Principle component score images of the ToF-SIMS data sets acquired after 34 days of charging.
(a) PC1 scores image for identifying phases using the positive ToF-SIMS data set acquired after 34 days of charging DSS with deuterium by using a peak list with secondary ions covering the main alloying elements. The bright regions represent the austenite phase (as proved by the loadings plot in shown Figure S2a). (b) PC1 scores image identifying locations rich in deuterium obtained from the negative SIMS data set acquired after 34 days and using the full peak list. Bright pixel indicate positive scores and correlate with the ferrite phase. (c) PC1 scores image obtained from the same data set but using a different peak list prepared to focus on carbides and nitrides. This image is identifying locations rich in N and C. Bright pixels indicate positive scores and correlate with the austenite phase. (d) PC2 scores image identifying locations rich in N, C and D (bright pixel means positive score) indicating graded accumulation of deuterium at the ferrite and austenite grain boundaries and at the ferrite/austenite interface (highest scores!) as well. All ToF-SIMS image acquisition settings and parameters are given in table S3 in SI.
Figure 3Principle component score and secondary electron images of the ToF-SIMS data sets acquired after 37 days of charging.
(a) PC1 scores image obtained from the positive SIMS data set acquired after 37 days of charging DSS and used to identify phases in the DSS micro structure. A fresh region of interest (ROI) has been selected. The bright regions represent the austenite phase (as shown in the loading plot in Figure S2a). (b) PC1 scores image related to locations rich in deuterium. The image was generated by PCA of a negative ToF-SIMS image data set obtained after loading with deuterium for 37 days. The bright deuterium-rich areas have positive scores and correspond to the ferrite phase while the dark areas have negative scores and relate to austenite grains. (c) Ion induced secondary electron (SE) image of displaying grains in the DSS microstructure at the selected region of interest.