Literature DB >> 26831961

Vibration-insensitive measurements of the thickness profile of large glass panels.

Jungjae Park, Jaeseok Bae, Jonghan Jin, Jong-Ahn Kim, Jae Wan Kim.   

Abstract

We propose and realize a modified spectral-domain interferometer to measure the physical thickness profile and group refractive index distribution of a large glass substrate simultaneously. The optical layout was modified based on a Mach-Zehnder type interferometer, which was specially adopted to be insensitive to mechanical vibration. According to the measurement results of repeated experiments at a length of 820 mm along the horizontal axis, the standard deviations of the physical thickness and group refractive index were calculated to be 0.173 μm and 3.4 × 10(-4), respectively. To verify the insensitivity to vibration, the physical thickness values were monitored at a stationary point while the glass panel was swung at an amplitude exceeding 20 mm. The uncertainty components were evaluated, and the combined measurement uncertainty became 161 nm (k = 1) for a glass panel with a nominal thickness of 0.7 mm.

Year:  2015        PMID: 26831961     DOI: 10.1364/OE.23.032941

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  4 in total

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Journal:  Micromachines (Basel)       Date:  2022-07-07       Impact factor: 3.523

3.  Absolute Measurement of the Refractive Index of Water by a Mode-Locked Laser at 518 nm.

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4.  A Hybrid Non-destructive Measuring Method of Three-dimensional Profile of Through Silicon Vias for Realization of Smart Devices.

Authors:  Heulbi Ahn; Jaeseok Bae; Jungjae Park; Jonghan Jin
Journal:  Sci Rep       Date:  2018-10-26       Impact factor: 4.379

  4 in total

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