| Literature DB >> 26831573 |
Maoqing Yao1, Chunyang Sheng1, Mingyuan Ge1, Chun-Yung Chi1, Sen Cong1, Aiichiro Nakano1, P Daniel Dapkus1, Chongwu Zhou1.
Abstract
Monolithic integration of III-V semiconductors with Si has been pursued for some time in the semiconductor industry. However, the mismatch of lattice constants and thermal expansion coefficients represents a large technological challenge for the heteroepitaxial growth. Nanowires, due to their small lateral dimension, can relieve strain and mitigate dislocation formation to allow single-crystal III-V materials to be grown on Si. Here, we report a facile five-step heteroepitaxial growth of GaAs nanowires on Si using selective area growth (SAG) in metalorganic chemical vapor deposition, and we further report an in-depth study on the twin formation mechanism. Rotational twin defects were observed in the nanowire structures and showed strong dependence on the growth condition and nanowire size. We adopt a model of faceted growth to demonstrate the formation of twins during growth, which is well supported by both a transmission electron microscopy study and simulation based on nucleation energetics. Our study has led to twin-free segments in the length up to 80 nm, a significant improvement compared to previous work using SAG. The achievements may open up opportunities for future functional III-V-on-Si heterostructure devices.Entities:
Keywords: GaAs on Si; MOCVD; TEM; heteroepitaxy; nanowires; thermodynamics; twin defect
Year: 2016 PMID: 26831573 DOI: 10.1021/acsnano.5b07232
Source DB: PubMed Journal: ACS Nano ISSN: 1936-0851 Impact factor: 15.881