| Literature DB >> 26760447 |
Po-Chun Yeh1, Wencan Jin2, Nader Zaki2, Jens Kunstmann3,4, Daniel Chenet5, Ghidewon Arefe5, Jerzy T Sadowski6, Jerry I Dadap1, Peter Sutter7, James Hone5, Richard M Osgood1,2.
Abstract
Using angle-resolved photoemission on micrometer-scale sample areas, we directly measure the interlayer twist angle-dependent electronic band structure of bilayer molybdenum-disulfide (MoS2). Our measurements, performed on arbitrarily stacked bilayer MoS2 flakes prepared by chemical vapor deposition, provide direct evidence for a downshift of the quasiparticle energy of the valence band at the Brillouin zone center (Γ̅ point) with the interlayer twist angle, up to a maximum of 120 meV at a twist angle of ∼40°. Our direct measurements of the valence band structure enable the extraction of the hole effective mass as a function of the interlayer twist angle. While our results at Γ̅ agree with recently published photoluminescence data, our measurements of the quasiparticle spectrum over the full 2D Brillouin zone reveal a richer and more complicated change in the electronic structure than previously theoretically predicted. The electronic structure measurements reported here, including the evolution of the effective mass with twist-angle, provide new insight into the physics of twisted transition-metal dichalcogenide bilayers and serve as a guide for the practical design of MoS2 optoelectronic and spin-/valley-tronic devices.Entities:
Keywords: MoS2; Stacked van der Waals structures; low energy electron microscopy (LEEM); photoemission; spectromicroscopy; twisted van der Waals materials
Year: 2016 PMID: 26760447 DOI: 10.1021/acs.nanolett.5b03883
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189