| Literature DB >> 26744830 |
Aaron C Johnston-Peck1, Jonathan P Winterstein2, Alan D Roberts3, Joseph S DuChene3, Kun Qian3, Brendan C Sweeny3, Wei David Wei3, Renu Sharma2, Eric A Stach4, Andrew A Herzing5.
Abstract
Low-angle annular dark field (LAADF) scanning transmission electron microscopy (STEM) imaging is presented as a method that is sensitive to the oxidation state of cerium ions in CeO2 nanoparticles. This relationship was validated through electron energy loss spectroscopy (EELS), in situ measurements, as well as multislice image simulations. Static displacements caused by the increased ionic radius of Ce(3+) influence the electron channeling process and increase electron scattering to low angles while reducing scatter to high angles. This process manifests itself by reducing the high-angle annular dark field (HAADF) signal intensity while increasing the LAADF signal intensity in close proximity to Ce(3+) ions. This technique can supplement STEM-EELS and in so doing, relax the experimental challenges associated with acquiring oxidation state information at high spatial resolutions. Published by Elsevier B.V.Entities:
Keywords: Cerium dioxide; Point defects; Scanning transmission electron microscopy
Year: 2015 PMID: 26744830 PMCID: PMC4758117 DOI: 10.1016/j.ultramic.2015.12.004
Source DB: PubMed Journal: Ultramicroscopy ISSN: 0304-3991 Impact factor: 2.689