Literature DB >> 26734855

Characterization of the Stiffness of Multiple Particles Trapped by Dielectrophoretic Tweezers in a Microfluidic Device.

Myeonggu Son1, Seungyeop Choi1, Kwan Hwi Ko1, Min Hyung Kim1, Sei-Young Lee1, Jaehong Key1, Young-Ro Yoon1, In Soo Park1, Sang Woo Lee1.   

Abstract

Characterization of the stiffness of multiple particles trapped by tweezers-based force spectroscopy is a key step in building simple, high-throughput, and robust systems that can investigate the molecular interactions in a biological process, but the technology to characterize it in a given environment simultaneously is still lacking. We first characterized the stiffness of multiple particles trapped by dielectrophoretic (DEP) tweezers inside a microfluidic device. In this characterization, we developed a method to measure the thermal fluctuations of the trapped multiple particles with DEP tweezers by varying the heights of the particles in the given environment at the same time. Using the data measured in this controlled environment, we extracted the stiffness of the trapped particles and calculated their force. This study not only provides a simple and high-throughput method to measure the trap stiffness of multiple particles inside a microfluidic device using DEP tweezers but also inspires the application of the trapped multiple particles to investigate the dynamics in molecular interactions.

Mesh:

Substances:

Year:  2016        PMID: 26734855     DOI: 10.1021/acs.langmuir.5b03677

Source DB:  PubMed          Journal:  Langmuir        ISSN: 0743-7463            Impact factor:   3.882


  1 in total

1.  Non-Linear Cellular Dielectrophoretic Behavior Characterization Using Dielectrophoretic Tweezers-Based Force Spectroscopy inside a Microfluidic Device.

Authors:  Seungyeop Choi; Kwanhwi Ko; Jongwon Lim; Sung Hoon Kim; Sung-Hun Woo; Yoon Suk Kim; Jaehong Key; Sei Young Lee; In Su Park; Sang Woo Lee
Journal:  Sensors (Basel)       Date:  2018-10-19       Impact factor: 3.576

  1 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.