Recovering higher dimensional image data using multiplexed structured illumination.

Structured illumination (SI) using non-uniform intensity patterns is well-known for improving lateral resolution in microscopy. Here, we propose a multiplexed SI technique for recovering images with higher lateral resolution and with higher dimensional information at the same time. In this framework, we use unknown non-uniform intensity patterns for incoherent sample illumination and use the corresponding acquisitions for image recovery. In the first example, we use the reported framework to recover sample images with higher lateral resolution and separate different sections of the sample along the z-direction. In the second example, we recover the sample images with higher lateral resolution and separate the images at different spectral bands. The reported multiplexed-SI framework may find applications in general imaging settings where higher dimensional information is mixed in 2D image measurements. It can also be used in microscopy settings for computational sectioning and multispectral imaging.